A New Specimen for Measuring the Interfacial Toughness of Al-0.5%Cu Thin Film on Si Substrate
2005 ◽
pp. 521-526
2005 ◽
Vol 297-300
◽
pp. 521-526
2009 ◽
Vol 2009
(0)
◽
pp. 113-114
2008 ◽
Vol 2008
(0)
◽
pp. _OS1216-1_-_OS1216-2_
2004 ◽
Vol 53
(8)
◽
pp. 846-849
◽
2001 ◽
Vol 30
(12)
◽
pp. 1537-1548
◽
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