Measurement of Dislocation Density in Cold-Drawn Steel Wires by Means of X-Ray Bragg Profiles Analysis

2012 ◽  
Vol 184-185 ◽  
pp. 1054-1059
Author(s):  
Fan Yang ◽  
Ying Ying Fan ◽  
Yi Ming Jin
Keyword(s):  
Dislocation Density ◽  
True Strain ◽  
Pearlitic Steel ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Steel Wires ◽  
Initial Dislocation Density ◽  
Cold Worked

Cold-drawn pearlitic steel wires are widely used in numerous engineering fields. One of the most powerful analysis methods on determining the dislocation character of this heavily cold worked material is to investigate the X–ray diffraction line-profile broadening. Fourier line–broadening analysis in steel wires with near eutectoid composition indicates that with cumulative true strains, the initial dislocation density of 6×1014m-2in the rods increases at least one magnitude in wires. Up to 1.5×1016m-2of dislocation density is found in the ferrite lamella of wires with a true strain of 2.77.

Macro-and Microstrain Relaxation in Annealed Ag Films During Ageing at Room Temperature

1997 ◽  
Vol 505 ◽  
Author(s):  
R. C. Currie ◽  
R. Delhez ◽  
E. J. Mitiemeijer
Keyword(s):  
Room Temperature ◽  
Strain Relaxation ◽  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Thermally Induced ◽  
X Ray ◽  
Diffraction Line Profile ◽  
The Matrix ◽  
Profile Position

ABSTRACTThe relaxation of thermally induced strain in 500 nm thick polycrystalline Ag layers electron-beam deposited onto Si wafers was traced during ageing at room temperature. The layers consisted predominantly of matrix crystallites with {111} planes parallel to the surface and twin crystallites with {51 l} planes parallel to the surface. The macrostrain in the plane of the layer was determined from the X-ray diffraction line-profile position and the microstrain from the diffraction-line broadening. The residual macrostress relaxed from 160 MPa to 30 MPa in the matrix crystallites and from 170 MPa to 50 MPa in the twin crystallites. Simultaneously with the decrease in macrostress the microstrain decreases significantly for both texture fractions. The strain relaxation behaviour is governed by movement and subsequent annihilation of defects in the layer.

Dislocations, crystallite size, and planar faults in nanocrystalline ceria

2009 ◽  
Vol 24 (3) ◽  
pp. 228-233 ◽  
Author(s):  
S. R. Aghdaee ◽  
V. Soleimanian
Keyword(s):  
Grain Size ◽  
Dislocation Density ◽  
Crystallite Size ◽  
Cerium Oxide ◽  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanocrystalline Ceria ◽  
Hall Plot

The modified Williamson–Hall and Warren–Averbach methods were used successfully for analyzing experimentally observed anisotropic X-ray diffraction line broadening and for determining reliable values of crystallite size and dislocation density in cerium oxide. The modified Williamson–Hall plot gives 22.3(2) nm for volume-weighted crystallite size, while the modified Warren–Averbach produces 18.0(2) nm for area-weighted grain size. The dislocation density and effective outer cut-off radius of dislocations obtained from the modified Warren–Averbach method are 1.8(3)×1015 m−2 and 15.5(1) nm, respectively.

scholarly journals Distribution and Anisotropy of Dislocations in Cold-drawn Pearlitic Steel Wires Analyzed Using Micro-beam X-ray Diffraction

2015 ◽  
Vol 55 (7) ◽  
pp. 1432-1438 ◽  
Author(s):  
Shigeo Sato ◽  
Takahisa Shobu ◽  
Kozue Satoh ◽  
Hiromi Ogawa ◽  
Kazuaki Wagatsuma ◽  
...  
Keyword(s):  
Pearlitic Steel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Steel Wires

X-ray diffraction line broadening due to dislocations in non-cubic crystalline materials. III. Experimental results for plastically deformed zirconium

1989 ◽  
Vol 22 (4) ◽  
pp. 299-307 ◽  
Author(s):  
R. Kužel ◽  
P. Klimanek
Keyword(s):  
Profile Analysis ◽  
Theoretical Calculations ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Analytical Functions ◽  
Profile Fitting

Procedures of X-ray diffraction line profile analysis for the evaluation of the dislocation content in plastically deformed hexagonal materials were tested by means of conventional powder diffractometry on polycrystalline zirconium deformed under tension at 77 K. In order to obtain a representative picture of the dislocation-induced X-ray line broadening a series of reflections was measured. The integral breadths and the Fourier coefficients were evaluated by both direct profile-shape analysis and profile fitting with analytical functions. The results show a significant anisotropy of the line broadening. The 0001 reflections are clearly less broadened than most of the others. According to the theoretical calculations presented previously such a phenomenon can be expected if the plastic deformation favours generation of dislocations with Burgers vectors a/3 〈2{\bar 1} {\bar 1}0〉.

Nondestructive Structure Analysis of High-Strength Steel Wire for Suspension Bridge Engineering

2012 ◽  
Vol 174-177 ◽  
pp. 1415-1418
Author(s):  
Fan Yang ◽  
Ying Ying Fan
Keyword(s):  
Steel Wire ◽  
High Strength ◽  
Pearlitic Steel ◽  
Suspension Bridge ◽  
Bridge Engineering ◽  
Nondestructive Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Simulation Based ◽  
Cold Worked

High strength of drawn pearlitic steel wire is widely utilized in suspension bridge engineering. One of the most powerful nondestructive analysis methods on determining the dislocation character of this heavily cold worked material is the analysis in the broadening in the X–ray diffraction lines. In this letter, line-profile simulation based on Fourier analysis in the drawn steel wire is employed. The analytical process taking size and dislocation broadening into account provides the dislocation character on density and arrangement parameters, which is beyond effective over conventional metallographical approach.

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