Macro-and Microstrain Relaxation in Annealed Ag Films During Ageing at Room Temperature

1997 ◽  
Vol 505 ◽  
Author(s):  
R. C. Currie ◽  
R. Delhez ◽  
E. J. Mitiemeijer
Keyword(s):  
Room Temperature ◽  
Strain Relaxation ◽  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Thermally Induced ◽  
X Ray ◽  
Diffraction Line Profile ◽  
The Matrix ◽  
Profile Position

ABSTRACTThe relaxation of thermally induced strain in 500 nm thick polycrystalline Ag layers electron-beam deposited onto Si wafers was traced during ageing at room temperature. The layers consisted predominantly of matrix crystallites with {111} planes parallel to the surface and twin crystallites with {51 l} planes parallel to the surface. The macrostrain in the plane of the layer was determined from the X-ray diffraction line-profile position and the microstrain from the diffraction-line broadening. The residual macrostress relaxed from 160 MPa to 30 MPa in the matrix crystallites and from 170 MPa to 50 MPa in the twin crystallites. Simultaneously with the decrease in macrostress the microstrain decreases significantly for both texture fractions. The strain relaxation behaviour is governed by movement and subsequent annihilation of defects in the layer.

X-ray diffraction line broadening due to dislocations in non-cubic crystalline materials. III. Experimental results for plastically deformed zirconium

1989 ◽  
Vol 22 (4) ◽  
pp. 299-307 ◽  
Author(s):  
R. Kužel ◽  
P. Klimanek
Keyword(s):  
Profile Analysis ◽  
Theoretical Calculations ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Analytical Functions ◽  
Profile Fitting

Procedures of X-ray diffraction line profile analysis for the evaluation of the dislocation content in plastically deformed hexagonal materials were tested by means of conventional powder diffractometry on polycrystalline zirconium deformed under tension at 77 K. In order to obtain a representative picture of the dislocation-induced X-ray line broadening a series of reflections was measured. The integral breadths and the Fourier coefficients were evaluated by both direct profile-shape analysis and profile fitting with analytical functions. The results show a significant anisotropy of the line broadening. The 0001 reflections are clearly less broadened than most of the others. According to the theoretical calculations presented previously such a phenomenon can be expected if the plastic deformation favours generation of dislocations with Burgers vectors a/3 〈2{\bar 1} {\bar 1}0〉.

Temperature-induced structural phase transitions in RERhSn (RE = Y, Gd-Tm, Lu)

2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Simon Engelbert ◽  
Rolf-Dieter Hoffmann ◽  
Jutta Kösters ◽  
Steffen Klenner ◽  
Rainer Pöttgen
Keyword(s):  
Rare Earth ◽  
Phase Transitions ◽  
Driving Force ◽  
Room Temperature ◽  
Structural Phase ◽  
Structural Phase Transitions ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Temperature Dependent ◽  
X Ray

Abstract The structures of the equiatomic stannides RERhSn with the smaller rare earth elements Y, Gd-Tm and Lu were reinvestigated on the basis of temperature-dependent single crystal X-ray diffraction data. GdRhSn crystallizes with the aristotype ZrNiAl at 293 and 90 K. For RE = Y, Tb, Ho and Er the HP-CeRuSn type (approximant with space group R3m) is already formed at room temperature, while DyRhSn adopts the HP-CeRuSn type below 280 K. TmRhSn and LuRhSn show incommensurate modulated variants with superspace groups P31m(1/3; 1/3; γ) 000 (No. 157.1.23.1) (γ = 3/8 for TmRhSn and γ = 2/5 for LuRhSn). The driving force for superstructure formation (modulation) is a strengthening of Rh–Sn bonding. The modulation is expressed in a 119Sn Mössbauer spectrum of DyRhSn at 78 K through line broadening.

X-Ray Diffraction Study of Hep Metals. I. Line Broadening in Polycrystalline Cd Powder

1974 ◽  
Vol 29 (12) ◽  
pp. 1771-1777 ◽  
Author(s):  
N. C. Haider ◽  
S. H. Hunter
Keyword(s):  
Room Temperature ◽  
Small Deformation ◽  
Correction Factors ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Fault Probability ◽  
Large Particle Size ◽  
X Ray ◽  
Melting Temperatures ◽  
Diffraction Patterns

Powder Cd of 99.999% purity was prepared at room temperature (25 °C) and x-ray diffraction patterns were obtained using CuKaα radiation with Ni-filter. The line broadening was analyzed after incorporating the appropriate correction factors. At room temperature Cd was found to have large particle size (653 A), small root mean square strain (.001), small deformation fault probability a (.003). and negligible growth fault probability β(0). Compared to other hep metals which have been studied earlier and which have higher melting temperatures, metal Cd is much less affected by mechanical deformation at room temperature.

X-ray diffraction line broadening on vibrating dry-milled Two Crows sepiolite

2006 ◽  
Vol 54 (3) ◽  
pp. 390-401 ◽  
Author(s):  
Joaquin Bastida ◽  
Marek A. Kojdecki ◽  
Pablo Pardo ◽  
Pedro Amorós
Keyword(s):  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray

X-Ray Diffraction Analysis on Crystallite Development of Nanostructured Aluminium

2006 ◽  
Vol 118 ◽  
pp. 53-58
Author(s):  
Elisabeth Meijer ◽  
Nicholas Armstrong ◽  
Wing Yiu Yeung
Keyword(s):  
Crystallite Size ◽  
Room Temperature ◽  
Annealing Temperature ◽  
Equal Channel Angular Extrusion ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Integral Breadth ◽  
X Ray ◽  
Heat Treated ◽  
Diffraction Peaks

This study is to investigate the crystallite development in nanostructured aluminium using x-ray line broadening analysis. Nanostructured aluminium was produced by equal channel angular extrusion at room temperature to a total deformation strain of ~17. Samples of the extruded metal were then heat treated at temperatures up to 300oC. High order diffraction peaks were obtained using Mo radiation and the integral breadth was determined. It was found that as the annealing temperature increased, the integral breadth of the peak reflections decreased. By establishing the modified Williamson-Hall plots (integral breadth vs contract factor) after instrumental correction, it was determined that the crystallite size of the metal was maintained ~80 nm at 100oC. As the annealing temperature increased to 200oC, the crystallite size increased to ~118 nm. With increasing annealing temperature, the hardness of the metal decreased from ~60 HV to ~45 HV.

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