Effects on Morphology Change on the Mg-Doped Zinc-Oxide Surface Measured by Changing the AFM Feedback Speed

Use Atomic Force Microscope to analyze surface morphology of the laboratory prepared Mg-doped zinc oxide films and standard gratings. Main measuring method is the use of semi-contact mode of the Atomic Force Microscope (tapping mode). When parameters such as frequencies and gains do not change, we focus on the differences of the results under different feedback speed (FB) working on the specimens, and sum up the relations between the feedback speed (FB) and the definition of the surface morphology of the specimens.

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Redesigned Sensor Holder for an Atomic Force Microscope with an Adjustable Probe Direction

International Journal of Precision Engineering and Manufacturing ◽

10.1007/s12541-021-00561-7 ◽

2021 ◽

Author(s):

Janik Schaude ◽

Maxim Fimushkin ◽

Tino Hausotte

Keyword(s):

Atomic Force Microscope ◽

Piezoelectric Actuator ◽

High Speed ◽

Closed Loop ◽

Coefficient Of Thermal Expansion ◽

Measuring System ◽

Contact Mode ◽

Loop Control ◽

Atomic Force ◽

Measuring Machine

AbstractThe article presents a redesigned sensor holder for an atomic force microscope (AFM) with an adjustable probe direction, which is integrated into a nano measuring machine (NMM-1). The AFM, consisting of a commercial piezoresistive cantilever operated in closed-loop intermitted contact-mode, is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The axes greatly enlarge the metrology frame of the measuring system by materials with a comparatively high coefficient of thermal expansion. The AFM is therefore operated within a thermostating housing with a long-term temperature stability of 17 mK. The sensor holder, connecting the rotational axes and the cantilever, inserted one adhesive bond, a soldered connection and a geometrically undefined clamping into the metrology circle, which might also be a source of measurement error. It has therefore been redesigned to a clamped senor holder, which is presented, evaluated and compared to the previous glued sensor holder within this paper. As will be shown, there are no significant differences between the two sensor holders. This leads to the conclusion, that the three aforementioned connections do not deteriorate the measurement precision, significantly. As only a minor portion of the positioning range of the piezoelectric actuator is needed to stimulate the cantilever near its resonance frequency, a high-speed closed-loop control that keeps the cantilever within its operating range using this piezoelectric actuator further on as actuator was implemented and is presented within this article.

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Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head

Sensors ◽

10.3390/s21020362 ◽

2021 ◽

Vol 21 (2) ◽

pp. 362

Author(s):

Luke Oduor Otieno ◽

Bernard Ouma Alunda ◽

Jaehyun Kim ◽

Yong Joong Lee

Keyword(s):

Atomic Force Microscope ◽

Natural Frequency ◽

High Speed ◽

Contact Mode ◽

Ongoing Process ◽

Atomic Force ◽

Constant Height ◽

Mode Tracking

A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest component determines the overall bandwidth of the instrument. In this work, we present a design of a compact HS-AFM scan-head featuring minimal loading on the Z-scanner. Using a custom-programmed controller and a high-speed lateral scanner, we demonstrate its working by obtaining topographic images of Blu-ray disk data tracks in contact- and tapping-modes. Images acquired using a contact-mode cantilever with a natural frequency of 60 kHz in constant deflection mode show good tracking of topography at 400 Hz. In constant height mode, tracking of topography is demonstrated at rates up to 1.9 kHz for the scan size of 1μm×1μm with 100×100 pixels.

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The improvement of the accuracy of electromagnetic actuator based atomic force microscope operating in contact mode and the development of a new methodology for the estimation of control parameters and the achievement of superior image quality

Sensors and Actuators A Physical ◽

10.1016/j.sna.2019.01.015 ◽

2019 ◽

Vol 287 ◽

pp. 168-176 ◽

Cited By ~ 1

Author(s):

Inga Morkvenaite-Vilkonciene ◽

Darius Virzonis ◽

Andrius Dzedzickis ◽

Vytautas Bucinskas ◽

Juste Rozene ◽

...

Keyword(s):

Image Quality ◽

Atomic Force Microscope ◽

Electromagnetic Actuator ◽

Control Parameters ◽

Contact Mode ◽

Atomic Force ◽

Superior Image Quality

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Manipulation of Nickel Nanoparticles Deposited on HOPG

MRS Proceedings ◽

10.1557/proc-853-i5.9 ◽

2004 ◽

Vol 853 ◽

Cited By ~ 3

Author(s):

Massood Z. Atashbar ◽

Valery N. Bliznyuk ◽

Srikanth Singamaneni

Keyword(s):

Atomic Force Microscope ◽

Magnetic Force ◽

Nickel Nanoparticles ◽

Pyrolytic Graphite ◽

Critical Force ◽

Contact Mode ◽

Cyclic Voltametry ◽

Atomic Force ◽

Nickel Nanowires ◽

Plating Solution

ABSTRACTNickel nanowires were fabricated by electrodepositing Ni from an aqueous plating solution onto the step edges of Highly Oriented Pyrolytic Graphite (HOPG). Freshly cleaved HOPG was exposed to a plating solution of nickel and electro chemically deposited by cyclic voltametry. The morphology of the deposited nanoparticles was studied using an Atomic Force Microscope (AFM) in non-contact mode. The magnetic force of interaction between the nanoparticles was studied by magnetizing the particles. The critical force to displace the nanoparticles was estimated using contact mode of AFM.

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Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope

Japanese Journal of Applied Physics ◽

10.1143/jjap.33.379 ◽

1994 ◽

Vol 33 (Part 1, No. 1B) ◽

pp. 379-382 ◽

Cited By ~ 7

Author(s):

Yoshinobu Fukano ◽

Takayuki Uchihashi ◽

Takahiro Okusako ◽

Ayumi Chayahara ◽

Yasuhiro Sugawara ◽

...

Keyword(s):

Atomic Force Microscope ◽

Time Evolution ◽

Silicon Oxide ◽

Oxide Surface ◽

Atomic Force

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Atomic Paths in Scanning of the AFM Tip above the Close-Packed Surface in Repulsive Mode

Surface Review and Letters ◽

10.1142/s0218625x98001341 ◽

1998 ◽

Vol 05 (05) ◽

pp. 989-996

Author(s):

E. V. Blagov ◽

G. L. Klimchitskaya ◽

V. M. Mostepanenko

Keyword(s):

Atomic Force Microscope ◽

Vertical Resolution ◽

Contact Mode ◽

Atomic Force ◽

Elastic Approximation

The paths are calculated for the surface and tip apex atoms when scanning the AFM tip above the close-packed lattice in contact mode. The interaction of the sample and the tip atoms is considered in elastic approximation. The dependence of the atomic paths on the type of the tip and its orientation is investigated. It is shown that the vertical characteristic sizes of the atomic paths are several times larger than the vertical resolution of the atomic force microscope.

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