Impregnated Molecular Sieves as a Catalyst for the Isopropylation of Naphthalene

2013 ◽  
Vol 329 ◽  
pp. 45-50 ◽  
Author(s):  
Xin Zhang ◽  
Xi Dong Liu
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Molecular Sieves ◽  
Catalytic Properties ◽  
Fixed Bed ◽  
Optimum Conditions ◽  
Reaction Conditions ◽  
Energy Dispersion Spectrometer ◽  
Micro Reactor ◽  
Scanning Electron

At refluence temperature, ferric chloride impregnated molecular sieves were prepared by impregnation of FeCl3 through ion-exchanging methods. The above catalysts were characterized by the means of SEM/EDS (scanning electron microscope/energy dispersion spectrometer) and BET. The catalytic properties on isopropylation of naphthalene and effect of reaction conditions were carried out with fixed-bed flow micro-reactor. We obtained the optimum conditions of this reaction. At this condition, the conversion of naphthalene reaches 44.1%, the yield of 2, 6-DIPN is 41.2% and the selectivity of β,β-DIPN is 85.2%.

Manufacture and Characterization of TiO2 Nanowires by CVD

2011 ◽  
Vol 415-417 ◽  
pp. 697-700 ◽  
Author(s):  
Wei Long Liu ◽  
Shu Huei Hsieh ◽  
Wen Jauh Chen
Keyword(s):  
Electron Microscope ◽  
Elevated Temperature ◽  
Scanning Electron Microscope ◽  
Gas Mixture ◽  
Energy Dispersion ◽  
Energy Dispersion Spectrometer ◽  
Nanosized Titania ◽  
Scanning Electron

Under the catalysis of Co metal, the nanosized titania could be grown on Ti substrate at elevated temperature under a gas mixture of N2, O2, CH4 , and H2O. The nanosized titania was characterized by scanning electron microscope for its morphology, and by an energy dispersion spectrometer for its composition. The results showed that the straight and long titania nanowire could be formed at 900°C under a gas mixture of N2, O2, and CH4. When H2O vapor was added to the gas mixture, the titania nanowire became somewhat curved. The tiania nanowire was oxygen deficient, i.e. TiO2-X.

Bifunctional Pt-Molecular Sieve Catalysts for Hydroisomerization of Long-Chain Olefins

2011 ◽  
Vol 418-420 ◽  
pp. 2250-2254
Author(s):  
Fei Ding ◽  
Cai Rong Luo ◽  
Hai Rong Zhang ◽  
Lian Xiong ◽  
Xin De Chen
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Molecular Sieves ◽  
Molecular Sieve ◽  
Textural Properties ◽  
Product Distribution ◽  
Bifunctional Catalysts ◽  
Long Chain ◽  
Scanning Electron

Bifunctional Pt/HZSM-5, Pt/HBeta, Pt/HMCM-41 and Pt/HSAPO-11 catalysts were prepared using pseudoboehmite as a binder. The H2-TPR profiles, scanning electron microscope (SEM) and brunauer-emmett-teller (BET) pointed out that reducibility of catalysts and textural properties. These bifunctional catalysts have been tested in long-chain olefins hydroisomerization. The experiments were carried out at 320oC under 2.0 MPa of hydrogen and at 3.0 h-1WHSV. Complete hydrogenation of long-chain olefins was observed over Pt/HMCM-41 and Pt/HSAPO-11. Hydroisomerization reactions also occured in the case of Pt supported strong acidic molecular sieves (HZSM-5 and HBeta). The result suggests product distribution of long-chain olefins hydroisomerization is dependent on the balance between the acid and metallic functions in catalysts.

Anti-Friction Effect of Graphite Nonasheets Formed by Sonicating Expanded Graphite

2012 ◽  
Vol 189 ◽  
pp. 210-213
Author(s):  
Zhi Guo Liu
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Liquid Medium ◽  
Weight Ratio ◽  
Expanded Graphite ◽  
Optimum Conditions ◽  
Base Oil ◽  
Graphite Nanosheets ◽  
Friction Effect ◽  
Scanning Electron

Graphite nanosheets were prepared by sonicating expanded graphite (EG) in a liquid medium. The products were characterized by scanning electron microscope (SEM), and its anti-friction effect used as additive of base oil was investigated. The influencing factors of its anti-friction effect, the weight ratio of graphite nanosheets to base oil, the sonicating medium and sonicating time, were studied and optimized. The results show that under the optimum conditions the graphite nanosheets exhibit an excellent anti-friction effect.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

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