Mineralogical characterization of a lignite gasification ash from a low-BTU fixed-bed gasifier II. Scanning electron microscope phase analysis

1984 ◽  
Vol 14 (4) ◽  
pp. 485-490 ◽  
Author(s):  
Robert J. Stevenson
2021 ◽  
Vol 14 (3) ◽  
pp. 1787
Author(s):  
Rafaela Teixeira Paula ◽  
Geraldo César Rocha

Materiais saprolíticos constituem importantes seções no recorte vertical da paisagem. São materiais ainda pouco conhecidos e demandam maior dedicação. Para caracterização destes materiais pode-se fazer uso de técnicas mineralogia e micromorfologia como a difração de Raios-X (DRX) e o Microscópio Eletrônico de Varredura (MEV). O DRX é uma técnica de caracterização de estruturas cristalinas. O MEV é um tipo de microscópio capaz de produzir imagens de alta resolução da superfície de materiais sólidos. O objetivo é caracterizar amostras de materiais intemperizados de diferentes rochas. Foram selecionados cinco perfis de intemperismo  em Juiz de Fora - MG. Os parâmetros utilizados para a análise física e mineralógica foram os seguintes: cor, textura, consistência, rocha de origem e grau de alteração, mineralogia e micromorfologia. A cor é variável entre e intra amostras, é dependente dos minerais constituintes e do grau de alteração. A textura está ligada aos minerais constituintes e seus tamanhos, que são dependentes de seus graus de alteração. A consistência é dependente da resistência dos minerais constituintes e da alteração. As rochas de origem são o quartzito ou o gnaisse. Os principais minerais encontrados foram quartzo, biotita, muscovita e caulinita. Quanto maior a porcentagem de argila, menor a consistência e maior o grau de alteração. A presença de minerais mais resistentes tende a dificultar a pedogênese, resultando em perfis mais arenosos, com poucos minerais de argila e sem atividade biológica. Nos perfis em que predomina o quartzo, apesar da presença desse mineral, o grau de alteração é elevado. Physical and Mineralogical Characterization of Weathering Materials in the Urban Area of Juiz de Fora - MG through Macroscopic Analysis, X-Ray Diffractometer and Scanning Electron Microscope ABSTRACTSaprolitic materials are important sections in the vertical cutout of the landscape. These materials are still little known and demand greater dedication. To characterize these materials, we can use mineral and micromorphological techniques such as X-ray diffraction, a technique for characterizing crystalline structures and the Scanning Electron Microscope, a type of microscope capable of producing high-resolution images of the surface of solid materials. The objective is to characterize weathered colors of different stones. Five weathering profiles were selected in Juiz de Fora - MG. The parameters used for physical and mineralogical analysis were as follows: color, texture, consistency, original rock and degree of change, mineralogy and micromorphology. The color is variable, depends on the constituent minerals and the degree of change. The texture is linked to the constituent minerals and their sizes, which depend on their degree of change. The consistency is dependent on the strength of the constituent minerals and the degree of change. The original rocks are quartzite and gneiss. The main minerals found were quartz, biotite, muscovite and kaolinite. The higher the clay percentage, the lower the consistency and the greater the degree of change. The presence of more resistant mineralsmakes pedogenesis difficult, resulting in more sandy profiles, with few clay minerals and without biological activity. In profiles that predominate quartz, despite the presence of this mineral, the degree of change is high.Keywords: Mineralogy; Micromorphology; Weathering material.


Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.


2015 ◽  
Vol 1109 ◽  
pp. 381-384
Author(s):  
M. Safwan Azmi ◽  
Sharipah Nadzirah ◽  
Uda Hashim

The purpose of this paper is to study the morphological characterization of aluminum interdigitated electrodes (IDE) of different gap sizes on silicon substrate. The electrodes were fabricated using standard photolithography process and were done so with sizes of 12 μm, 10 μm and 7 μm. The electrodes were morphologically characterized using scanning electron microscope (SEM) and high-powered microscope (HPM).Keywords: morphological, interdigitated electrodes, aluminum


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