A Study on Scalability and Variation of CMOS Low Noise Amplifier in Advance CMOS Technology Processes
2016 ◽
Vol 833
◽
pp. 135-139
Keyword(s):
Recent technology requires multistandard Radio Frequency (RF) chips for multipurpose wireless applications. In RF circuits, a low-noise amplifier (LNA) plays the key role in determining the receiver’s performance. With CMOS technology scaling, various designs has been adopted to study circuit’s characteristic and variation. In this paper, we present the results of scalable wideband LNA design based on complementary metal oxide semiconductor (CMOS), with its variance study. The design was fabricated in 180nm, 90nm, 65nm and 40nm CMOS technology.
2012 ◽
Vol 51
◽
pp. 04DE07
◽
2010 ◽
Vol 49
(4)
◽
pp. 04DE11
◽
2011 ◽
Vol 50
(4S)
◽
pp. 04DE01
◽
2011 ◽
Vol 98
(2)
◽
pp. 235-248
◽
2014 ◽
2018 ◽
Vol 12
(5)
◽
pp. 630-637
◽
2018 ◽
Vol 12
(1)
◽
pp. 21-33
2012 ◽
Vol 51
(4S)
◽
pp. 04DE07
◽
2011 ◽
Vol 5
(12)
◽
pp. 1495
◽