Preparation of CaBi4Ti4O15 Based Thick Films on Si Substrates by Screen Printing

2009 ◽  
Vol 421-422 ◽  
pp. 50-53
Author(s):  
Tatsunori Kakuda ◽  
Tomoaki Futakuchi ◽  
Tsutomu Obata ◽  
Yuichi Sakai ◽  
Masatoshi Adachi

CaBi4Ti4O15 based thick films were prepared by screen-printing method on Si substrates. Screen-printable pastes were prepared by kneading the CaBi4Ti4O15 powder in a three-roll mill with an organic vehicle. The remanent polarization of 6.3 C/cm2 and coercive field of 130kV/cm were obtained for the CaBi4Ti4O15 with Nb2O5 1wt% thick film fired at 1130°C. The cavity structure was prepared by etching of Si substrate. The displacement-electric field butterfly curves were obtained.

2007 ◽  
Vol 124-126 ◽  
pp. 663-666 ◽  
Author(s):  
Sung Gap Lee ◽  
Sang Man Park ◽  
Young Jae Shim ◽  
Young Chul Rhee

PZT(70/30) powder was prepared by a sol-gel method and PZT thick films were fabricated by the screen-printing method on the alumina substrates. The coating and drying procedure was repeated 4 times. And then the PZT(30/70) precusor solution was spin-coated on the PZT thick films. A concentration of a coating solution was 0.5 mol/L and the number of coating was varied from 0 to 6. The porosity decreased and the grain size increased with increasing the number of coatings. The thickness of the PZT-6(6: number of coatings) films was about 60~65μm. All PZT thick films showed the typical XRD patterns of a typical perovskite polycrystalline structure. The relative dielectric constant of the PZT-6 thick film was 540. The remanent polarization and coercive field of the PZT-6 film were 23.6 μC /cm2, 12.0 kV/cm, respectively.


2008 ◽  
Vol 388 ◽  
pp. 187-190 ◽  
Author(s):  
Tomoaki Futakuchi ◽  
Tatsunori Kakuda ◽  
Yuichi Sakai ◽  
Shigeki Kakiuchi ◽  
Masatoshi Adachi

MBi4Ti4O15 (M=Ba,Ca) thick films were prepared by screen printing and firing using Pt bottom electrodes and ZrO2 substrates. Screen-printable pastes were prepared by kneading the MBi4Ti4O15 powder in a three-roll mill with an organic vehicle. The microstructures and electric properties of the thick films were examined in comparison with bulk ceramics. The remanent polarization of 6.2 9C/cm2 and coercive field of 130kV/cm were obtained for the CaBi4Ti4O15 thick film fired at 1130OC. The Curie points of MBi4Ti4O15 (M=Ba,Ca) thick films from dielectric peaks were 450OC and 790 OC for M=Ba and M= Ca.


2013 ◽  
Vol 582 ◽  
pp. 55-58 ◽  
Author(s):  
Tomoaki Futakuchi ◽  
Tatsunori Kakuda ◽  
Yuichi Sakai

0.67BiFeO3-0.33BaTiO3thick films were prepared by screen printing pastes prepared by kneading the 0.67BiFeO3-0.33BaTiO3powder in a three-roll mill with an organic vehicle. The thick films were fired with Pt bottom electrodes and ZrO2substrates to investigate the influence of firing temperature. The microstructures and ferroelectric properties of the thick films were examined and compared with the bulk ceramics. A remanent polarization of 32.0 μC/cm2and coercive field of 28 kV/cm were obtained for a thick film with the addition of 0.5 wt% MnO that was fired at 1050 °C.


2007 ◽  
Vol 350 ◽  
pp. 115-118 ◽  
Author(s):  
Tomoaki Futakuchi ◽  
Tatsunori Kakuda ◽  
Yuichi Sakai ◽  
Takashi Iijima ◽  
Masatoshi Adachi

Bi4Ti3O12 based thick films were prepared by screen printing and firing using Pt bottom electrodes and ZrO2 substrates. The influence of excess Bi2O3 as sintering aid was investigated. Furthermore, substitution of Ti-site and Bi-site for V5+ and Nd3+ was performed. Screen-printable pastes were prepared by kneading the Bi4Ti3O12 based powder and Bi2O3 powder in a three-roll mill with an organic vehicle. The microstructures and ferroelectric properties of the thick films were examined in comparison with bulk ceramics. The remanent polarization of 9.6 μC/cm2 and coercive field of 64 kV/cm were obtained for the Bi3.0Nd1.0Ti2.99V0.01O12 thick film with 10 wt% of excess Bi2O3 fired at 1200OC.


2008 ◽  
Vol 15 (01n02) ◽  
pp. 41-45
Author(s):  
SUNG-GAP LEE ◽  
HYUN-JI NOH ◽  
YOUNG-HIE LEE

Ferroelectric PbZr 0.6 Ti 0.4 O 3 (PZT) thick films were fabricated using a combination of screen-printing method and PZT precursor sol coating process (M. Koch, N. Harris, R. Maas, A. G. R. Evans, N. M. White and A. Brunnschweiler, Meas. Sci. Technol.8 (1997) 49; Y. S. Yoon, J. Korean. Phys. Soc.47 (2005) 321). Structural and electrical properties of the PZT thick films with the treatment of sol coating were investigated. The porosity decreased and the densification was enhanced with increasing the number of sol coatings. All PZT thick films showed the typical X-ray diffraction patterns of a perovskite polycrystalline structure. The thickness of all thick films was approximately 60–61 μm. The relative dielectric constant increased and dielectric loss decreased with increasing the number of sol coatings, and the values of the six-layer PZT-6 film were 167.8, 0.78% at 1 kHz, respectively. The remanent polarization and coercive field of the 6-coated PZT-6 thick films were 14.1 μC/cm2 and 20.3 kV/cm, respectively.


2011 ◽  
Vol 01 (01) ◽  
pp. 119-125 ◽  
Author(s):  
W. CHEN ◽  
C. X. HUANG ◽  
T. S. YAN ◽  
W. ZHU ◽  
Z. P. LI ◽  
...  

CoFe 2 O 4/ Pb ( Zr 0.53 Ti 0.47) O 3 (abbreviated as CFO/PZT) multiferroic composite thick films were successfully fabricated on alumina substrate with gold bottom electrode by screen printing method at a low-sintering temperature. The processing included the modification and dispersion of ferromagnetic CFO powder and ferroelectric PZT powder, the preparation of uniform pastes, and the selection of proper annealing temperature for composite thick films. Transmission electron microscopic pictures (TEM) indicated the submicron meter of particles size for both CFO and PZT particles. After annealing at 900°C for 1 h in air, tape test confirmed the quality of multiferroic thick films as well as pure CFO and PZT films. X-ray diffraction (XRD) showed a coexistence of CFO and PZT phases; furthermore, a smooth surface was observed through scanning electron microscopic (SEM) pictures along with the sharp cross-sectional picture, indicative of 100 μm of film thickness. Ferromagnetic and ferroelectric properties were observed in CFO/PZT films simultaneously at room temperature. Compared with the reported CFO/PZT multiferrroic thin films, the present ferromagnetic property was closing to that of the chemical sol-gel synthesized film and even that from the physical pulsed laser deposition technique. However, the ferroelectric property showed a degenerated behavior, possible reasons for this was discussed and further optimization was also proposed for the potential multifunctional application.


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