DENSIFICATION AND FERROELECTRIC PROPERTIES OF PZT(60/40) THICK FILMS FABRICATED BY SCREEN-PRINTING METHOD

2008 ◽  
Vol 15 (01n02) ◽  
pp. 41-45
Author(s):  
SUNG-GAP LEE ◽  
HYUN-JI NOH ◽  
YOUNG-HIE LEE

Ferroelectric PbZr 0.6 Ti 0.4 O 3 (PZT) thick films were fabricated using a combination of screen-printing method and PZT precursor sol coating process (M. Koch, N. Harris, R. Maas, A. G. R. Evans, N. M. White and A. Brunnschweiler, Meas. Sci. Technol.8 (1997) 49; Y. S. Yoon, J. Korean. Phys. Soc.47 (2005) 321). Structural and electrical properties of the PZT thick films with the treatment of sol coating were investigated. The porosity decreased and the densification was enhanced with increasing the number of sol coatings. All PZT thick films showed the typical X-ray diffraction patterns of a perovskite polycrystalline structure. The thickness of all thick films was approximately 60–61 μm. The relative dielectric constant increased and dielectric loss decreased with increasing the number of sol coatings, and the values of the six-layer PZT-6 film were 167.8, 0.78% at 1 kHz, respectively. The remanent polarization and coercive field of the 6-coated PZT-6 thick films were 14.1 μC/cm2 and 20.3 kV/cm, respectively.

2007 ◽  
Vol 124-126 ◽  
pp. 663-666 ◽  
Author(s):  
Sung Gap Lee ◽  
Sang Man Park ◽  
Young Jae Shim ◽  
Young Chul Rhee

PZT(70/30) powder was prepared by a sol-gel method and PZT thick films were fabricated by the screen-printing method on the alumina substrates. The coating and drying procedure was repeated 4 times. And then the PZT(30/70) precusor solution was spin-coated on the PZT thick films. A concentration of a coating solution was 0.5 mol/L and the number of coating was varied from 0 to 6. The porosity decreased and the grain size increased with increasing the number of coatings. The thickness of the PZT-6(6: number of coatings) films was about 60~65μm. All PZT thick films showed the typical XRD patterns of a typical perovskite polycrystalline structure. The relative dielectric constant of the PZT-6 thick film was 540. The remanent polarization and coercive field of the PZT-6 film were 23.6 μC /cm2, 12.0 kV/cm, respectively.


2011 ◽  
Vol 01 (01) ◽  
pp. 119-125 ◽  
Author(s):  
W. CHEN ◽  
C. X. HUANG ◽  
T. S. YAN ◽  
W. ZHU ◽  
Z. P. LI ◽  
...  

CoFe 2 O 4/ Pb ( Zr 0.53 Ti 0.47) O 3 (abbreviated as CFO/PZT) multiferroic composite thick films were successfully fabricated on alumina substrate with gold bottom electrode by screen printing method at a low-sintering temperature. The processing included the modification and dispersion of ferromagnetic CFO powder and ferroelectric PZT powder, the preparation of uniform pastes, and the selection of proper annealing temperature for composite thick films. Transmission electron microscopic pictures (TEM) indicated the submicron meter of particles size for both CFO and PZT particles. After annealing at 900°C for 1 h in air, tape test confirmed the quality of multiferroic thick films as well as pure CFO and PZT films. X-ray diffraction (XRD) showed a coexistence of CFO and PZT phases; furthermore, a smooth surface was observed through scanning electron microscopic (SEM) pictures along with the sharp cross-sectional picture, indicative of 100 μm of film thickness. Ferromagnetic and ferroelectric properties were observed in CFO/PZT films simultaneously at room temperature. Compared with the reported CFO/PZT multiferrroic thin films, the present ferromagnetic property was closing to that of the chemical sol-gel synthesized film and even that from the physical pulsed laser deposition technique. However, the ferroelectric property showed a degenerated behavior, possible reasons for this was discussed and further optimization was also proposed for the potential multifunctional application.


2009 ◽  
Vol 23 (31n32) ◽  
pp. 3785-3791
Author(s):  
SUNG-PILL NAM ◽  
HYUN-JI NOH ◽  
SUNG-GAP LEE ◽  
SEON-GI BAE ◽  
YOUNG-HIE LEE

The heterolayered BT/BNT thick films were fabricated by screen printing techniques on alumina substrates electrodes with Pt . Their structure and ferroelectric properties were investigated with the heterolayered tetragonal/rhombohedral structure composed of the BT and the BNT thick films. The structural and electrical properties of the heterolayered BT/BNT thick films were studied. The dielectric properties such as dielectric constant, loss and remanent polarization of the heterolayered BT/BNT thick films were superior to those of single composition BNT, and those values for the heterolayered BT/BNT thick films were 1455, 0.025 and 12.63 µC/cm2.


2007 ◽  
Vol 336-338 ◽  
pp. 381-383
Author(s):  
Sung Gap Lee ◽  
Young Jae Shim ◽  
Cheol Jin Kim ◽  
Won Tae Bae ◽  
Kyu Hong Hwang ◽  
...  

Ferroelectric PZT heterolayered thick films were fabricated by the alkoxide-based sol-gel method. PZT(20/80) and PZT(80/20) paste were made and alternately screen-printed on the alumina substrates. The coating and drying procedure was repeated 4 times to form the heterolayered thick films. The thickness of the PZT heterolayered thick films was approximately 60 μm. All PZT thick films showed the typical XRD patterns of a perovskite polycrystalline structure. The relative dielectric constant and the dielectric loss of the PZT thick films sintered at 1050oC were 283 and 1.90%, respectively.


2009 ◽  
Vol 421-422 ◽  
pp. 50-53
Author(s):  
Tatsunori Kakuda ◽  
Tomoaki Futakuchi ◽  
Tsutomu Obata ◽  
Yuichi Sakai ◽  
Masatoshi Adachi

CaBi4Ti4O15 based thick films were prepared by screen-printing method on Si substrates. Screen-printable pastes were prepared by kneading the CaBi4Ti4O15 powder in a three-roll mill with an organic vehicle. The remanent polarization of 6.3 C/cm2 and coercive field of 130kV/cm were obtained for the CaBi4Ti4O15 with Nb2O5 1wt% thick film fired at 1130°C. The cavity structure was prepared by etching of Si substrate. The displacement-electric field butterfly curves were obtained.


2007 ◽  
Vol 544-545 ◽  
pp. 633-636
Author(s):  
Sung Gap Lee ◽  
Sang Man Park

Ferroelectric Pb(Zr0.6Ti0.4)O3 (PZT(60/40)) powder was prepared by a sol-gel method and PZT thick films were fabricated by the screen-printing method on the alumina substrates. The Pt bottom electrodes were screen-printed on the alumina substrate. The PZT(60/40) thick films were annealed at 1050°C for 10min in PbO atmosphere. Pb(Zr0.4Ti0.6)O3 (PZT(40/60)) precursor solution, which prepared by sol-gel method, was spin-coated on the PZT thick films to obtain a densification. These PZT multilayered thick films were annealed at 650°C for 2 h in PbO atmosphere. The upper electrodes were fabricated by screen printing the Ag paste and then firing at 590°C for 10min. Its structural and electrical properties of the PZT thick films with the treatment of PZT(40/60) precursor solution coating were investigated. The coating and drying procedure was repeated 4 times. And then the PZT(40/60) precursor solution was spin-coated on the multilayered thick films. A concentration of a coating solution was 1.5 mol/L and the number of coating was repeated from 0~15. The porosity of the thick films was decreased with increasing the number of coatings. All PZT multilayered thick films showed the XRD patterns of typical peroveskite polycrystalline structure. The relative dielectric constant of the PZT-15 (15: number of solution coatings) thick film were 370. And the PZT-15 thick film shows the remanent polarization of 23.5 μC/cm2 and coercive field of 18.0 kV/cm, respectively.


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