Influence of Electron Irradiation Induced Defects on the Current-Voltage Characteristics of a Resonant Tunneling Diode

1993 ◽  
Vol 143-147 ◽  
pp. 1553-1558
Author(s):  
B. Grandidier ◽  
Didier Stiévenard ◽  
D. Deresmes ◽  
O. Vanbesien ◽  
D. Lippens ◽  
...  
Keyword(s):  
Electron Irradiation ◽  
Resonant Tunneling ◽  
Resonant Tunneling Diode ◽  
Tunneling Diode ◽  
Current Voltage ◽  
Current Voltage Characteristics ◽  
Induced Defects ◽  
Irradiation Induced Defects

Simulation of Polarization Effect in GaN/AlN Resonant Tunneling Diode

2013 ◽  
Vol 774-776 ◽  
pp. 691-694
Author(s):  
Nai Yun Tang
Keyword(s):  
Electronic Properties ◽  
Resonant Tunneling ◽  
Polarization Effect ◽  
Resonant Tunneling Diode ◽  
Band Diagram ◽  
Poisson Equations ◽  
Tunneling Diode ◽  
Current Voltage ◽  
Self Consistent ◽  
Current Voltage Characteristics

Influence of polarization effect on current across GaN/AlNresonant tunneling diode (RTD) is simulated by self-consistent calculations ofSchrödinger and Poisson equations. When taking into account polarization chargesat the heterointerface, the band diagram and electronic properties of RTD areobviously changed. As a result, the current-voltage characteristics showsasymmetrical phenomenon. As the polarization effect is enhanced, the resonancepeak is shifted accordingly and even disappears.

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