Characteristically Asymmetric X-Ray Line Broadening, an Indication of Residual Long-Range internal Stresses

1994 ◽  
Vol 166-169 ◽  
pp. 23-44 ◽  
Author(s):  
Tamás Ungár
2013 ◽  
Vol 61 (20) ◽  
pp. 7741-7748 ◽  
Author(s):  
I-Fang Lee ◽  
Thien Q. Phan ◽  
Lyle E. Levine ◽  
Jonathan Z. Tischler ◽  
Peter T. Geantil ◽  
...  
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2008 ◽  
Vol 604-605 ◽  
pp. 39-51 ◽  
Author(s):  
M.E. Kassner ◽  
P. Geantil ◽  
L.E. Levine ◽  
B.C. Larson

Backstresses or long range internal stresses (LRIS) in the past have been suggested by many to exist in plastically deformed crystalline materials. Elevated stresses can be present in regions of elevated dislocation density or dislocation heterogeneities in the deformed microstructures. The heterogeneities include edge dislocation dipole bundles (veins) and the edge dipole walls of persistent slip bands (PSBs) in cyclically deformed materials and cell and subgrain walls in monotonically deformed materials. The existence of long range internal stress is especially important for the understanding of cyclic deformation and also monotonic deformation. X-ray microbeam diffraction experiments performed by the authors using synchrotron x-ray microbeams determined the elastic strains within the cell interiors. The studies were performed using, oriented, monotonically deformed Cu single crystals. The results demonstrate that small long-range internal stresses are present in cell interiors. These LRIS vary substantially from cell to cell as 0 % to 50 % of the applied stress. The results are related to the Bauschinger effect, often explained in terms of LRIS.


1997 ◽  
Vol 503 ◽  
Author(s):  
B. L. Evans ◽  
J. B. Martin ◽  
L. W. Burggraf

ABSTRACTThe viability of a Compton scattering tomography system for nondestructively inspecting thin, low Z samples for corrosion is examined. This technique differs from conventional x-ray backscatter NDI because it does not rely on narrow collimation of source and detectors to examine small volumes in the sample. Instead, photons of a single energy are backscattered from the sample and their scattered energy spectra are measured at multiple detector locations, and these spectra are then used to reconstruct an image of the object. This multiplexed Compton scatter tomography technique interrogates multiple volume elements simultaneously. Thin samples less than 1 cm thick and made of low Z materials are best imaged with gamma rays at or below 100 keV energy. At this energy, Compton line broadening becomes an important resolution limitation. An analytical model has been developed to simulate the signals collected in a demonstration system consisting of an array of planar high-purity germanium detectors. A technique for deconvolving the effects of Compton broadening and detector energy resolution from signals with additive noise is also presented. A filtered backprojection image reconstruction algorithm with similarities to that used in conventional transmission computed tomography is developed. A simulation of a 360–degree inspection gives distortion-free results. In a simulation of a single-sided inspection, a 5 mm × 5 mm corrosion flaw with 50% density is readily identified in 1-cm thick aluminum phantom when the signal to noise ratio in the data exceeds 28.


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