High Resolution TEM Observation of in Situ Colloid Formation in CaF2 Crystals

1997 ◽  
Vol 239-241 ◽  
pp. 671-674 ◽  
Author(s):  
V.S. Teodorescu ◽  
Liviu Nistor ◽  
J. Van Landuyt
Keyword(s):  
High Resolution ◽  
High Resolution Tem ◽  
Colloid Formation

Research on Laser Full-Penetration Welding In Situ TiB2 Particulate Reinforced ZL101 Composites

2010 ◽  
Vol 97-101 ◽  
pp. 3967-3973 ◽  
Author(s):  
Hai Chao Cui ◽  
Feng Gui Lu ◽  
Xin Hua Tang ◽  
Shun Yao
Keyword(s):  
High Resolution ◽  
Laser Power ◽  
Particle Distribution ◽  
Welding Process ◽  
Full Penetration ◽  
High Resolution Tem ◽  
Tib2 Particles ◽  
Particulate Reinforced ◽  
Al Matrix

Laser full-penetration welding of novel in situ TiB2 particulate reinforced ZL101 composites was studied using three different welding velocities synchronized with proper laser power. The optimal welding process parameters for laser full-penetration welding of in situ TiB2 reinforced ZL101 composites were suggested. The SEM results show that few pores and uniform particle distribution were obtained. TiB2 particles are intimately contacted with Al matrix according to the results of high-resolution TEM. There was no evidence of chemical reaction at the interface.

Structural changes of Au nanocones during in situ cold-field emission observed by high-resolution TEM

2016 ◽  
pp. 135-136
Author(s):  
Ludvig de Knoop ◽  
Norvik Voskanian ◽  
Andrew Yankovich ◽  
Kristof Lodewijks ◽  
Alexandre Dmitriev ◽  
...  
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Structural Changes ◽  
High Resolution Tem

In situ High Resolution TEM Observation of Solid-gas Reactions at High Temperatures

2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
K Kishita ◽  
T Kamino ◽  
S Arai ◽  
K Kuroda ◽  
H Saka
Keyword(s):  
High Resolution ◽  
High Temperatures ◽  
High Resolution Tem ◽  
Gas Reactions

Statistically Analyzed Photoresponse of Elastically Bent CdS Nanowires Probed by Light-Compatible In Situ High-Resolution TEM

Nano Letters ◽  
2016 ◽  
Vol 16 (10) ◽  
pp. 6008-6013 ◽  
Author(s):  
Chao Zhang ◽  
Ovidiu Cretu ◽  
Dmitry G. Kvashnin ◽  
Naoyuki Kawamoto ◽  
Masanori Mitome ◽  
...  
Keyword(s):  
High Resolution ◽  
High Resolution Tem ◽  
Cds Nanowires

Study of The Quasicrystal Formation in Zr46.8Ti8.2Cu7.5Ni10Be27.5 Bulk Metallic Glass

2002 ◽  
Vol 754 ◽  
Author(s):  
J.L. Soubeyroux ◽  
J.M. Pelletier ◽  
B. Van de Moortèle ◽  
T. Epicier
Keyword(s):  
High Resolution ◽  
Electron Diffraction ◽  
Metallic Glasses ◽  
Melt Spinning ◽  
Isothermal Annealing ◽  
Primary Phase ◽  
High Resolution Tem ◽  
In Situ Neutron Diffraction ◽  
Primary Crystals

ABSTRACTThe formation of the primary crystals appearing during isothermal annealing of the Zr46.8Ti8.2Cu7.5Ni10Be27.5 (Vit4) bulk metallic glasses has been studied by in-situ neutron diffraction, DSC, high resolution TEM and electron diffraction. We have evidenced that the primary phase appearing on the isothermal plateau at 620 K is quasicrystalline and is beryllium free. Moreover, we have prepared an alloy with the composition determined by EDX (without beryllium), and studied the formation of quasicrystals in this alloy. A comparison is done between the quasicrystalline phases appearing during the annealing of Vit4 and the quasicrystals prepared without beryllium in an amorphous alloy prepared by melt spinning. In particular they have the same intensities and peak positions in the diffraction studies.

Microstructural evolution of NiFe/Ag multilayers studied by X-ray diffraction and in situ high-resolution TEM

1995 ◽  
Vol 151 (1-2) ◽  
pp. 24-32 ◽  
Author(s):  
E. Snoeck ◽  
R. Sinclair ◽  
M.A. Parker ◽  
T.L. Hylton ◽  
K.R. Coffey ◽  
...  
Keyword(s):  
High Resolution ◽  
Microstructural Evolution ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Resolution Tem

scholarly journals In Situ and High Resolution TEM Studies of Nano-scale Materials

2009 ◽  
Vol 15 (S2) ◽  
pp. 1200-1201
Author(s):  
R Sinclair ◽  
AL Koh ◽  
P Kempen ◽  
HJ Jung
Keyword(s):  
High Resolution ◽  
Nano Scale ◽  
High Resolution Tem

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

New observation of nanoscale interfacial evolution in micro Cu–Al wire bonds by in-situ high resolution TEM study

2016 ◽  
Vol 115 ◽  
pp. 1-5 ◽  
Author(s):  
Hui Xu ◽  
Ivy Qin ◽  
Horst Clauberg ◽  
Bob Chylak ◽  
Viola L. Acoff
Keyword(s):  
High Resolution ◽  
Wire Bonds ◽  
High Resolution Tem ◽  
Interfacial Evolution

Self Healing Nanoparticles: In-situ High-Resolution TEM Indentation of Nanoparticles

2008 ◽  
Vol 14 (S2) ◽  
pp. 252-253
Author(s):  
CE Carlton ◽  
PJ Ferreira
Keyword(s):  
New Mexico ◽  
High Resolution ◽  
Self Healing ◽  
High Resolution Tem

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-Situ and High-Resolution Tem Observation of Interfacial Reactions in Metal-Silicon Multilayers

1987 ◽  
Vol 103 ◽  
Author(s):  
Karen Holloway ◽  
Khiem BA Do ◽  
Robert Sinclair
Keyword(s):  
High Resolution ◽  
Cross Section ◽  
Sputter Deposition ◽  
Amorphous Nature ◽  
High Resolution Tem ◽  
Kirkendall Voids ◽  
Point To Point ◽  
Titanium Silicon ◽  
Annealing Experiments

ABSTRACTTitanium-silicon and molybdenum-silicon multilayers have been investigated in cross-section using a high resolution TEM with a point-to-point resolution of .22 nm. This resolution has allowed us to confirm the amorphous nature both of the intermixed layers which form at the metal-silicon interfaces on sputter deposition, and of the Ti-Si reaction product which forms at temperatures below which crystalline silicides nucleate.The bulk studies are complemented by in-situ annealing experiments in the high-resolution microscope. Phase reactions in the multilayers can be followed in real time, allowing direct observation of the formation of the amorphous alloy, the appearance of rows of Kirkendall voids, and the crystallization and growth of silicide phases.

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