Optical Characterization of Mercury Cadmium Telluride Epitaxial Layers with Arbitrary Degree of Carrier Degeneracy

1998 ◽  
Vol 282-283 ◽  
pp. 131-138 ◽  
Author(s):  
Z. Djurić ◽  
Z.M. Jakšić ◽  
Z. Djinović ◽  
V. Jović
Keyword(s):  
Cadmium Telluride ◽  
Mercury Cadmium Telluride ◽  
Optical Characterization ◽  
Epitaxial Layers ◽  
Arbitrary Degree

Electrical and optical characterization of grain boundaries in polycrystalline cadmium telluride

1986 ◽  
Vol 60 (10) ◽  
pp. 3622-3630 ◽  
Author(s):  
Thomas P. Thorpe ◽  
Alan L. Fahrenbruch ◽  
Richard H. Bube
Keyword(s):  
Grain Boundaries ◽  
Cadmium Telluride ◽  
Optical Characterization

scholarly journals Modeling and Characterization of MTF and Spectral Response at Small Pitch on Mercury Cadmium Telluride

2015 ◽  
Vol 44 (9) ◽  
pp. 3157-3162 ◽  
Author(s):  
J. Berthoz ◽  
R. Grille ◽  
L. Rubaldo ◽  
O. Gravrand ◽  
A. Kerlain ◽  
...  
Keyword(s):  
Cadmium Telluride ◽  
Mercury Cadmium Telluride ◽  
Spectral Response ◽  
Small Pitch

Etch pit characterization of CdTe and CdZnTe substrates for use in mercury cadmium telluride epitaxy

1995 ◽  
Vol 24 (5) ◽  
pp. 505-510 ◽  
Author(s):  
W. J. Everson ◽  
C. K. Ard ◽  
J. L. Sepich ◽  
B. E. Dean ◽  
G. T. Neugebauer ◽  
...  
Keyword(s):  
Cadmium Telluride ◽  
Mercury Cadmium Telluride ◽  
Etch Pit ◽  
Cdznte Substrates

X-ray characterization of LPE mercury cadmium telluride

1988 ◽  
Vol 89 (4) ◽  
pp. 608-611 ◽  
Author(s):  
S. Bernardi ◽  
C. Ferrari ◽  
P. Franzosi
Keyword(s):  
Cadmium Telluride ◽  
Mercury Cadmium Telluride ◽  
X Ray
Sign in / Sign up

Export Citation Format

Share Document