Application of In Situ HREM to Study Crystallization in Materials

2005 ◽  
Vol 494 ◽  
pp. 7-12
Author(s):  
R. Sinclair ◽  
Kyung Hoon Min ◽  
U. Kwon
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Solid Phase ◽  
Tantalum Oxide ◽  
Nucleation And Growth ◽  
In Situ Observation ◽  
Amorphous Thin Films ◽  
Transmission Electron ◽  
Kinetics Of

A review is given of the application of in situ transmission electron microscopy to study various processes associated with the crystallization of amorphous thin films. Solid phase epitaxial regrowth of ion-implanted silicon is compared with nucleation and growth in deposited thin films. The mechanism of metal-mediated crystallization is deduced directly from high resolution recordings, and the kinetics of tantalum oxide devitrefication are obtained. The advantages of direct in situ observation are described

In situ observation of the martensitic transformation in (Mg,Y)-PSZ

1986 ◽  
Vol 44 ◽  
pp. 500-501
Author(s):  
R-R. Lee
Keyword(s):  
Martensitic Transformation ◽  
High Strength ◽  
Nucleation And Growth ◽  
In Situ Observation ◽  
Considerable Potential ◽  
Transmission Electron ◽  
Structural Applications ◽  
Applied Stresses ◽  
Kinetics Of

Partially-stabilized ZrO2 (PSZ) ceramics have considerable potential for advanced structural applications because of their high strength and toughness. These properties derive from small tetragonal ZrO2 (t-ZrO2) precipitates in a cubic (c) ZrO2 matrix, which transform martensitically to monoclinic (m) symmetry under applied stresses. The kinetics of the martensitic transformation is believed to be nucleation controlled and the nucleation is always stress induced. In situ observation of the martensitic transformation using transmission electron microscopy provides considerable information about the nucleation and growth aspects of the transformation.

Reactions in Metal-Metalloid Multilayers

1993 ◽  
Vol 311 ◽  
Author(s):  
Robert Sinclair ◽  
Toyohiko J. Konno
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Differential Scanning Calorimetry ◽  
Reactive Systems ◽  
Nucleation And Growth ◽  
In Situ Observation ◽  
Scanning Calorimetry ◽  
Compound Formation ◽  
Transmission Electron

ABSTRACTWe have studied the reactions at metal-metalloid interfaces using high resolution transmission electron microscopy, including in situ observation, and differential scanning calorimetry. There is contrasting behavior depending on the affinity for interaction or segregation. For reactive systems, compound formation ultimately results, but this can be preceded by solidstate amorphization. For non-reactive systems, crystallization of the metalloid is often achieved with nucleation and growth mediated by the metal phase.

In Situ Studies of Nitridation of Cu/Ti Thin Films Using Environmental Cell in Transmission Electron Microscopy

1993 ◽  
Vol 317 ◽  
Author(s):  
R. Sharma ◽  
Z. Atzmon ◽  
J. Mayer ◽  
S. Q. Hong
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Growth Rate ◽  
Reaction Dynamics ◽  
Nucleation And Growth ◽  
Copper Particles ◽  
Transmission Electron ◽  
Environmental Cell

ABSTRACTCo-deposited Cu/Ti thin films were heated at various temperatures in an ammonia ambient in an environmental cell fitted in to the column of transmission electron Microscope (TEM). The reaction dynamics was observed in situ and recorded on video using a TV camera with 1/30 sec. time resolution. The nitridation of titanium accompanied by nucleation and growth of copper particles started at 370°C. Ti2N formed at lower temperatures while TiN was formed above 400°C. The nucleation of crystals occurred simultaneously (within a Minute) throughout the film indicating no effect of electron beam on reaction process. The growth rate of copper particles was observed to vary slightly from one particle to another indicating varying growth rate for different facets.

Nucleation and Growth kinetics of Cu2O During Reduction of CuO Thin Films

1991 ◽  
Vol 230 ◽  
Author(s):  
Jian Li ◽  
K. N. Tu ◽  
J. W. Mayer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Boundary ◽  
Activation Enthalpy ◽  
Nucleation And Growth ◽  
Classical Analysis ◽  
Transmission Electron ◽  
Kinetics Of ◽  
O Phase

AbstractThe combination of 16O(α, α)16O oxygen resonance measurement and transmission electron microscopy (TEM) provides an unique and effective method to study the kinetics of nucleation and growth of Cu2O phase during reduction. In situ TEM observation showed that isolated and large Cu2O grains emerge from the small CuO grain matrix and the growth of Cu2O grains is linear with time. We propose that the discontinuous morphology of grain growth of Cu2O is due to the migration of the Cu2O-CuO phase boundary induced by oxygen out-diffusion along the moving phase boundary. Based on the classical analysis of phase transformation by Johnson, Mehl and Avrami, the activation enthalpy of nucleation of Cu2O phase in the CuO matrix has been deduced as ΔEn=2.3 eV. The specific interfacial energy between CuO and Cu2O phases has been estimated as 0.5 eV/atom.

scholarly journals In situ transmission electron microscopy studies of the kinetics of Pt-Mo alloy diffusion in ZrB2 thin films

2013 ◽  
Vol 103 (12) ◽  
pp. 121601 ◽  
Author(s):  
I. Jouanny ◽  
J. Palisaitis ◽  
C. Ngo ◽  
P. H. Mayrhofer ◽  
L. Hultman ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Transmission Electron ◽  
Kinetics Of

scholarly journals Nitrogen Effects on Crystallization Kinetics of Amorphous TiOxNy Thin Films

2002 ◽  
Vol 17 (3) ◽  
pp. 550-555 ◽  
Author(s):  
Kyle Hukari ◽  
Rand Dannenberg ◽  
E. A. Stach
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Activation Energy ◽  
Crystallization Behavior ◽  
Index Of Refraction ◽  
Transmission Electron ◽  
Growth Activation ◽  
Diffraction Patterns ◽  
Kinetics Of

The crystallization behavior of amorphous TiOxNy (x ≫ y) thin films was investigated by in situ transmission electron microscopy. The Johnson–Mehl–Avrami–Kozolog (JMAK) theory was used to determine the Avrami exponent, activation energy, and the phase velocity pre-exponent. Addition of nitrogen inhibited diffusion, increasing the nucleation temperature, while decreasing the growth activation energy. Kinetic variables extracted from individual crystallites were compared to JMAK analysis of the fraction transformed, and a change of 6% in the activation energy led to agreement between the methods. From diffraction patterns and index of refraction the crystallized phase was found to be predominantly anatase.

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