A New Method for Testing Electrolytic Capacitors to Compare Life Expectancy

2014 ◽  
Vol 2014 (DPC) ◽  
pp. 001759-001786 ◽  
Author(s):  
Stephani Gulbrandsen ◽  
Joelle Arnold ◽  
Nick Kirsch ◽  
Greg Caswell

Power system applications, such as street lighting, typically have a 10 year warranty. When these systems include electrolytic capacitors, it is important to choose a supplier that meets these requirements. Traditional lifetime testing of electrolytic capacitors to ascertain their life expectancy requires specialized equipment, is time consuming, labor intensive, and for most OEMs, is ultimately cost prohibitive. Electrolytic capacitors with the same capacitance and voltage ratings from different suppliers may be rated to the same lifetime, but historical data confirms that they can have significantly different operational expected lives. An accelerated testing methodology is needed to compare the reliability of electrolytic capacitors from different suppliers. DfR has developed an approach that reduces test times from thousands of hours to several weeks by taking advantage of two key behaviors of electrolytics. The first involves the rate at which capacitors lose electrolyte, which is fairly predictable at a given temperature and electrical stress. The second key behavior is the dependence of the equivalent series resistance (ESR) of electrolytic capacitors on the volume of liquid electrolyte. The approach that will be described in this paper will demonstrate a means of comparing the time to failure for comparable capacitors from different suppliers under the same conditions. Case studies will demonstrate how this method avoids the extended testing that is typically required.

2013 ◽  
Vol 333-335 ◽  
pp. 122-125
Author(s):  
Xu Fei Wang ◽  
Kai Xie ◽  
Teng Li ◽  
Zhong Qun Li ◽  
Rong Bin Guo

A cost-effective method for quickly evaluating the equivalent series resistance (ESR) of electrolytic capacitors is proposed. This approach has the ability to measure the low ESR of milliohms level, meanwhile provide the pulsed testing current up to hundreds of amperes. Therefore, this method is suitable for fast inspecting the quality of bulk capacitors. The operational principle, circuit implementation and the calibration method are presented, and the performances of the prototype are tested, which validate the proposed scheme.


Author(s):  
Chetan S. Kulkarni ◽  
Gautam Biswas ◽  
Xenofon Koutsoukos ◽  
Jose Celaya ◽  
Kai Goebel

Studying and analyzing the ageing mechanisms of electronic components avionics in systems such as the GPS and INAV are of critical importance. In DC-DC power converter systems electrolytic capacitors and MOSFET’s have higher failure rates among the components. Degradation in the capacitors under varying operating conditions leads to high ripples output voltages and currents affecting downstream components leading to cascading faults. For example, in avionics systems where the power supply drives a GPS unit, ripple currents can cause glitches in the GPS position and velocity output, and this may cause errors in the Inertial Navigation (INAV) system, causing the aircraft to fly off course The work in this paper proposes a detail experimental and systematic study on analyzing the degradation phenomenon is electrolytic capacitors under high stress operating conditions. The output degradation is typically measured by an increase in ESR (Equivalent Series Resistance) and decrease in the capacitance value. We present the details of our accelerated ageing methodology along with analysis and comparison of the results.


1975 ◽  
Vol 2 (1) ◽  
pp. 67-72 ◽  
Author(s):  
F. G. Hayatee

The analysis of electrolytic capacitors as a distributed network is examined. The parameters contributing to the equivalent series resistance (E.S.R.) have been determined for various production capacitors at low and high frequencies.


2007 ◽  
Vol 27 (2) ◽  
pp. 209-233 ◽  
Author(s):  
Enrique López Droguett ◽  
Ali Mosleh

In accelerated lifetime testing (ALT) the assumption of stress-independent spread in life is commonly used and accepted because the resulting models are typically easier to use and data or past experience suggest that such a constrain is sometimes valid. However in many situations and with a variety of products the spread in life does depend on stress, i.e., the failure mechanism is not the same for all stress levels. In this paper the assessment of product time to failure at service conditions from ALT with stress-dependent spread is addressed by formulating a Bayesian framework where the time to failure follows a Weibull distribution, scale parameter dependency on stress is given by the Power Law, and two cases for the dependency between shape parameter and stress are discussed: linear relationship and, in order to allow a comparative analysis, stress-independent shape parameter. A previously published dataset is used to illustrate the procedure.


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