scholarly journals Chemical characterization of an on emulsion interface via electron microscope observation of a frozen hydrated sample

1986 ◽  
Author(s):  
R J Mikula
Keyword(s):  
Electron Microscope ◽  
Chemical Characterization ◽  
Microscope Observation ◽  
Electron Microscope Observation ◽  
Hydrated Sample

Electron-microscope observation of dislocations in metals

1962 ◽  
Vol 76 (1) ◽  
pp. 109-152 ◽  
Author(s):  
L.G. Orlov ◽  
M.P. Usikov ◽  
L.M. Utevskii
Keyword(s):  
Electron Microscope ◽  
Microscope Observation ◽  
Electron Microscope Observation

ELECTRON MICROSCOPE OBSERVATION OF LATTICE DISORDER IN ION‐IMPLANTED SILICON

1971 ◽  
Vol 18 (6) ◽  
pp. 257-259 ◽  
Author(s):  
M. Bertolotti ◽  
D. Sette ◽  
L. Stagni ◽  
G. Vitali
Keyword(s):  
Electron Microscope ◽  
Microscope Observation ◽  
Electron Microscope Observation ◽  
Lattice Disorder ◽  
Ion Implanted

In situ reflection electron microscope observation of two-dimensional nucleation on Si(111) during epitaxial growth

1996 ◽  
Vol 281-282 ◽  
pp. 20-23 ◽  
Author(s):  
A.V. Latyshev ◽  
A.B. Krasilnikov ◽  
A.L. Aseev
Keyword(s):  
Electron Microscope ◽  
Epitaxial Growth ◽  
Microscope Observation ◽  
Electron Microscope Observation ◽  
Two Dimensional

ELECTRON-MICROSCOPE OBSERVATION OF DISLOCATIONS IN METALS

1962 ◽  
Vol 5 (1) ◽  
pp. 53-78 ◽  
Author(s):  
L G Orlov ◽  
M P Usikov ◽  
L M Utevskii
Keyword(s):  
Electron Microscope ◽  
Microscope Observation ◽  
Electron Microscope Observation

scholarly journals Effect of ZnDTP triboflim's morphology on friction behaviors of DLC coatings: Tribofilm characterization by 3D scanning electron microscope observation

2018 ◽  
Vol 12 (7) ◽  
pp. JAMDSM0129-JAMDSM0129 ◽  
Author(s):  
Kouami Auxence Melardot ABOUA ◽  
Noritsugu UMEHARA ◽  
Hiroyuki KOUSAKA ◽  
Takayuki TOKOROYAMA ◽  
Motoyuki MURASHIMA ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
3D Scanning ◽  
Microscope Observation ◽  
Electron Microscope Observation ◽  
Dlc Coatings ◽  
Scanning Electron Microscope Observation ◽  
Scanning Electron

In-situ scanning electron microscope observation of electromigration-induced void growth in 30 nm ½ pitch Cu interconnect structures

2014 ◽  
Vol 115 (7) ◽  
pp. 074305 ◽  
Author(s):  
K. Vanstreels ◽  
P. Czarnecki ◽  
T. Kirimura ◽  
Y. K. Siew ◽  
I. De Wolf ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Void Growth ◽  
Microscope Observation ◽  
Electron Microscope Observation ◽  
Scanning Electron Microscope Observation ◽  
Cu Interconnect ◽  
Scanning Electron
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