scholarly journals Analysis of Stacks Structure of Magnetic Multilayer Films by X-ray Reflectivity

2015 ◽  
Vol 66 (12) ◽  
pp. 642-647
Author(s):  
Kazuhiro UEDA
Keyword(s):  
Multilayer Films ◽  
Magnetic Multilayer ◽  
X Ray

X-ray scattering topography of metallic multilayer films

1993 ◽  
Vol 126 (1-3) ◽  
pp. 34-37
Author(s):  
T. Shinozaki ◽  
T. Hondoh ◽  
A. Goto ◽  
A. Takahashi ◽  
T. Takama ◽  
...  
Keyword(s):  
Multilayer Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Structural Properties Of Co/Re Superlattices

1991 ◽  
Vol 238 ◽  
Author(s):  
Y. Huai ◽  
R. W. Cochrane ◽  
Y. Shi ◽  
H. E. Fischer ◽  
M. Sutton
Keyword(s):  
Structural Disorder ◽  
Multilayer Films ◽  
Film Plane ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bilayer Films ◽  
Out Of Plane ◽  
Reflectivity Data ◽  
Sharp Interfaces ◽  
Good Agreement

ABSTRACTThe structures of equal-thickness Co/Re multilayer films and several Co/Re bilayer films have been investigated by X-ray diffraction at low and high angles. Analysis of low-angle reflectivity data from bilayer films indicates that interfacial intermixing is limited to three monolayers and that the two interfacial configurations are different. The high-angle X-ray diffraction data show that multilayer films have coherent interfaces and a highly textured structure with hep [002] orientations normal to the film plane for periods 21 Å ≤ Λ ≤220 Å. Detailed structures have been determined by fitting the X-ray spectra to calculated ones using a trapezoidal model. The results indicate that samples with 42 Å≤ Λ ≤220 Å have relatively sharp interfaces, in good agreement with the bilayer results. In addition, an out-of-plane expansion of the Co (002) layer is observed in samples with large Λ and results from structural disorder leading to a reduced atomic density. For Λ <21 Å the interfaces arise from the rougher surfaces of the deposited layers.

THE GIANT MAGNETOSTRICTION OF [Fe/Tb/Fe/Dy]n MULTILAYER FILMS UNDER DIFFERENT ANNEALING TEMPERATURE

2009 ◽  
Vol 16 (01) ◽  
pp. 123-126 ◽  
Author(s):  
X. D. LI ◽  
Z. J. ZHAO ◽  
T. FENG ◽  
L. K. PAN ◽  
S. M. HUANG ◽  
...  
Keyword(s):  
Saturation Magnetization ◽  
Annealing Temperature ◽  
Multilayer Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Low Field ◽  
Giant Magnetostriction

The effect of annealing temperature on the magnetic and giant magnetostriction (GMS) of [ Fe / Tb / Fe / Dy ]n multilayer films were investigated. X-ray diffraction showed that the multilayer films' microstructures were still in amorphous at annealing temperature 300°C. The multilayer films began to crystalline at annealing temperature 400°C. The saturation magnetization of multilayer films increased by the increasing annealed temperature. The coercivity first decreased at annealing temperature 300°C and then increased when the annealing temperature was higher than 400°C. The multilayer films had good low-field GMS, and the magnetostriction of the multilayer films increased by the increasing annealing temperature.

X-ray investigations of Langmuir-Blodgett multilayer films of side-chain liquid crystal copolymers

1994 ◽  
Vol 16 (5) ◽  
pp. 869-875 ◽  
Author(s):  
R. Geer ◽  
S. Qadri ◽  
R. Shashidhar ◽  
A. F. Thibodeaux ◽  
R. S. Duran
Keyword(s):  
Liquid Crystal ◽  
Multilayer Films ◽  
Side Chain ◽  
X Ray ◽  
Langmuir Blodgett

Self-Assembly of Inorganic/Organic Multilayer Films

1994 ◽  
Vol 351 ◽  
Author(s):  
Astrid C. Zeppenfeld ◽  
Catherine J. Page
Keyword(s):  
Self Assembly ◽  
Grazing Angle ◽  
Multilayer Films ◽  
Silicon Wafers ◽  
Initial Surface ◽  
X Ray Diffraction ◽  
Individual Layer ◽  
X Ray ◽  
Influence Of Substrate ◽  
The Individual

ABSTRACTIn order to investigate the influence of substrate functionalization on the subsequent selfassembly of multilayer films, multilayers composed of alternating hafnium and 1,10-decanediylbis(phosphonic) acid (DBPA) have been grown on three different substrates. Substrates studied include gold wafers functionalized with 4-mercaptobutylphosphonic acid, silicon wafers functionalized using a hafnium oxychloride solution, and silicon wafers coated with an octadecylphosphonate LB-template layer. The nature of these films is probed using ellipsometry and grazing angle x-ray diffraction. These studies indicate that the overall order and the individual layer thickness can vary substantially from sample to sample and depend strongly on the initial surface functionalization prior to multilayer growth.

scholarly journals Standing wave approach in the theory of X-ray magnetic reflectivity

2019 ◽  
Vol 26 (2) ◽  
pp. 483-496 ◽  
Author(s):  
M. A. Andreeva ◽  
R. A. Baulin ◽  
Yu. L. Repchenko
Keyword(s):  
Critical Angle ◽  
Specular Reflection ◽  
Standing Waves ◽  
Fourth Power ◽  
Magnetic Multilayer ◽  
X Ray ◽  
Depth Profiles ◽  
Kinematical Approach ◽  
Selection Of ◽  
Higher Sensitivity

An extension of the exact X-ray resonant magnetic reflectivity theory has been developed, taking into account the small value of the magnetic terms in the X-ray susceptibility tensor. It is shown that squared standing waves (fourth power of the total electric field) determine the output of the magnetic addition to the total reflectivity from a magnetic multilayer. The obtained generalized kinematical approach essentially speeds up the calculation of the asymmetry ratio in the magnetic reflectivity. The developed approach easily explains the peculiarities of the angular dependence of the reflectivity with the rotated polarization (such as the peak at the critical angle of the total external reflection). The revealed dependence of the magnetic part of the total reflectivity on the squared standing waves means that the selection of the reflectivity with the rotated polarization ensures higher sensitivity to the depth profiles of magnetization than the secondary radiation at the specular reflection condition.

Interfacial Composition and Structure in Pt/Ni and Pt/Nb Multilayer Films

1990 ◽  
Vol 187 ◽  
Author(s):  
J.A. Bain ◽  
B.M. Clemens ◽  
S. Brennan
Keyword(s):  
Lattice Spacing ◽  
Grazing Incidence ◽  
Multilayer Films ◽  
Interfacial Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Composition And Structure ◽  
Interfacial Composition ◽  
Alloying Effects ◽  
Coherent Interfaces

AbstractThe interfacial structure of Pt/Nb and Pt/Ni sputtered multilayer films was studied using x-ray diffraction in symmetric, asymmetric, and grazing incidence modes. The grazing incidence and asymmetric diffraction were used to distinguish alloying effects on the lattice spacing from strain in the films. This strain was shown to be consistent with semi-coherent interfaces in the Pt/Ni but not in the Pt/Nb in which another strain generating mechanism dominates.

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