Referee comment on 'An automated method for the evaluation of the pointing accuracy of sun-tracking devices'

2016 ◽  
Author(s):  
Anonymous
Keyword(s):  
Automated Method ◽  
Pointing Accuracy ◽  
Tracking Devices

scholarly journals An automated method for the evaluation of the pointing accuracy of sun-tracking devices

2016 ◽  
Author(s):  
Dietmar J. Baumgartner ◽  
Werner Pötzi ◽  
Heinrich Freislich ◽  
Heinz Strutzmann ◽  
Astrid M. Veronig ◽  
...  
Keyword(s):  
Solar Radiation ◽  
Monitoring System ◽  
Automated System ◽  
Accuracy Evaluation ◽  
Tracking Accuracy ◽  
Clear Sky ◽  
Automated Method ◽  
Pointing Accuracy ◽  
Sky Conditions ◽  
Tracking Devices

Abstract. The accuracy of solar radiation measurements (for direct and diffuse radiation) depends significantly on the precision of the operational sun-tracking device. Thus rigid targets for instrument performance and operation have been specified for international monitoring networks, such as e.g., the Baseline Surface Radiation Network (BSRN) operating under the auspices of the World Climate Research Program (WCRP). Sun-tracking devices fulfilling these accuracy requirements are available from various instrument manufacturers, however none of the commercially available systems comprises an automatic accuracy control system, allowing platform operators to independently validate the pointing accuracy of sun-tracking sensors during operation. Here we present KSO-STREAMS (KSO-SunTRackEr Accuracy Monitoring System), a fully automated, system independent and cost-effective method for evaluating the pointing accuracy of sun-tracking devices. We detail the monitoring system setup, its design and specifications and results from its application to the sun-tracking system operated at the Austrian RADiation network (ARAD) site Kanzelhöhe Observatory (KSO). Results from an evaluation campaign from March to June 2015 show that the tracking accuracy of the device operated at KSO lies for the vast majority of observations (99.8 %) within BSRN specifications (i.e., 0.1° tracking accuracy). Evaluation of manufacturer specified active tracking accuracies (0.02°), during periods with direct solar radiation exceeding 300 W m−2, shows that these are satisfied for 72.9 % of observations. Tracking accuracies are highest during clear-sky conditions and on days where prevailing clear-sky conditions are interrupted by frontal movement: in these cases we obtain complete fulfillment of BSRN requirements and 76.4 % of observations within manufacturer specified active tracking accuracies. Limitations to tracking surveillance arise during overcast conditions and periods of partial solar limb coverage by clouds. On days with variable cloud-cover 78.1 % (99.9 %) of observations meet active tracking (BSRN) accuracy requirements while for days with prevailing overcast conditions these numbers reduce to 64.3 % (99.5 %), respectively.

scholarly journals An automated method for the evaluation of the pointing accuracy of Sun-tracking devices

2017 ◽  
Vol 10 (3) ◽  
pp. 1181-1190 ◽  
Author(s):  
Dietmar J. Baumgartner ◽  
Werner Pötzi ◽  
Heinrich Freislich ◽  
Heinz Strutzmann ◽  
Astrid M. Veronig ◽  
...  
Keyword(s):  
Solar Radiation ◽  
Monitoring System ◽  
Surface Radiation ◽  
Automated System ◽  
Tracking Accuracy ◽  
Clear Sky ◽  
Automated Method ◽  
Pointing Accuracy ◽  
Sky Conditions ◽  
Tracking Devices

Abstract. The accuracy of solar radiation measurements, for direct (DIR) and diffuse (DIF) radiation, depends significantly on the precision of the operational Sun-tracking device. Thus, rigid targets for instrument performance and operation have been specified for international monitoring networks, e.g., the Baseline Surface Radiation Network (BSRN) operating under the auspices of the World Climate Research Program (WCRP). Sun-tracking devices that fulfill these accuracy requirements are available from various instrument manufacturers; however, none of the commercially available systems comprise an automatic accuracy control system allowing platform operators to independently validate the pointing accuracy of Sun-tracking sensors during operation. Here we present KSO-STREAMS (KSO-SunTRackEr Accuracy Monitoring System), a fully automated, system-independent, and cost-effective system for evaluating the pointing accuracy of Sun-tracking devices. We detail the monitoring system setup, its design and specifications, and the results from its application to the Sun-tracking system operated at the Kanzelhöhe Observatory (KSO) Austrian radiation monitoring network (ARAD) site. The results from an evaluation campaign from March to June 2015 show that the tracking accuracy of the device operated at KSO lies within BSRN specifications (i.e., 0.1° tracking accuracy) for the vast majority of observations (99.8 %). The evaluation of manufacturer-specified active-tracking accuracies (0.02°), during periods with direct solar radiation exceeding 300 W m−2, shows that these are satisfied in 72.9 % of observations. Tracking accuracies are highest during clear-sky conditions and on days where prevailing clear-sky conditions are interrupted by frontal movement; in these cases, we obtain the complete fulfillment of BSRN requirements and 76.4 % of observations within manufacturer-specified active-tracking accuracies. Limitations to tracking surveillance arise during overcast conditions and periods of partial solar-limb coverage by clouds. On days with variable cloud cover, 78.1 % (99.9 %) of observations meet active-tracking (BSRN) accuracy requirements while for days with prevailing overcast conditions these numbers reduce to 64.3 % (99.5 %).

Computer Indexing of Electron Diffraction Patterns Including the Effects of Lattice Symmetry

1977 ◽  
Vol 35 ◽  
pp. 22-23
Author(s):  
J. S. Lally ◽  
R. J. Lee
Keyword(s):  
Electron Diffraction ◽  
Zone Axis ◽  
Crystal Thickness ◽  
Double Diffraction ◽  
Automated Method ◽  
Lattice Symmetry ◽  
Intensity Calculations ◽  
Unknown Structure ◽  
Diffraction Patterns ◽  
Orientation Parameters

In the 50 year period since the discovery of electron diffraction from crystals there has been much theoretical effort devoted to the calculation of diffracted intensities as a function of crystal thickness, orientation, and structure. However, in many applications of electron diffraction what is required is a simple identification of an unknown structure when some of the shape and orientation parameters required for intensity calculations are not known. In these circumstances an automated method is needed to solve diffraction patterns obtained near crystal zone axis directions that includes the effects of systematic absences of reflections due to lattice symmetry effects and additional reflections due to double diffraction processes.Two programs have been developed to enable relatively inexperienced microscopists to identify unknown crystals from diffraction patterns. Before indexing any given electron diffraction pattern, a set of possible crystal structures must be selected for comparison against the unknown.

Automated method for isolation of human pancreatic islets

Diabetes ◽  
1988 ◽  
Vol 37 (4) ◽  
pp. 413-420 ◽  
Author(s):  
C. Ricordi ◽  
P. E. Lacy ◽  
E. H. Finke ◽  
B. J. Olack ◽  
D. W. Scharp
Keyword(s):  
Pancreatic Islets ◽  
Human Pancreatic Islets ◽  
Automated Method

Elucidating the Weakly Reversible Cs-Pb-Br Perovskite Nanocrystal Reaction Network with High-Throughput Maps and Transformations

2020 ◽  
Author(s):  
Jakob Dahl ◽  
Xingzhi Wang ◽  
Xiao Huang ◽  
Emory Chan ◽  
Paul Alivisatos
Keyword(s):  
High Throughput ◽  
Dynamic Equilibrium ◽  
Reaction Network ◽  
Substantial Impact ◽  
Equilibrium Behavior ◽  
Automated Method ◽  
Lead Bromide ◽  
Different Shapes ◽  
Complex Chemistry ◽  
Lead Halide

<p>Advances in automation and data analytics can aid exploration of the complex chemistry of nanoparticles. Lead halide perovskite colloidal nanocrystals provide an interesting proving ground: there are reports of many different phases and transformations, which has made it hard to form a coherent conceptual framework for their controlled formation through traditional methods. In this work, we systematically explore the portion of Cs-Pb-Br synthesis space in which many optically distinguishable species are formed using high-throughput robotic synthesis to understand their formation reactions. We deploy an automated method that allows us to determine the relative amount of absorbance that can be attributed to each species in order to create maps of the synthetic space. These in turn facilitate improved understanding of the interplay between kinetic and thermodynamic factors that underlie which combination of species are likely to be prevalent under a given set of conditions. Based on these maps, we test potential transformation routes between perovskite nanocrystals of different shapes and phases. We find that shape is determined kinetically, but many reactions between different phases show equilibrium behavior. We demonstrate a dynamic equilibrium between complexes, monolayers and nanocrystals of lead bromide, with substantial impact on the reaction outcomes. This allows us to construct a chemical reaction network that qualitatively explains our results as well as previous reports and can serve as a guide for those seeking to prepare a particular composition and shape. </p>

Automatic Registering and Stitching of TEM/STEM Image Mosaics

2013 ◽  
Author(s):  
Chung-Ching Lin ◽  
Franco Stellari ◽  
Lynne Gignac ◽  
Peilin Song ◽  
John Bruley
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Vlsi Circuit ◽  
Significant Progress ◽  
Research Areas ◽  
Automated Method ◽  
Transmission Electron ◽  
Stem Image ◽  
High Resolution Images ◽  
Global Optimal

Abstract Transmission Electron Microscopy (TEM) and scanning TEM (STEM) is widely used to acquire ultra high resolution images in different research areas. For some applications, a single TEM/STEM image does not provide enough information for analysis. One example in VLSI circuit failure analysis is the tracking of long interconnection. The capability of creating a large map of high resolution images may enable significant progress in some tasks. However, stitching TEM/STEM images in semiconductor applications is difficult and existing tools are unable to provide usable stitching results for analysis. In this paper, a novel fully automated method for stitching TEM/STEM image mosaics is proposed. The proposed method allows one to reach a global optimal configuration of each image tile so that both missing and false-positive correspondences can be tolerated. The experiment results presented in this paper show that the proposed method is robust and performs well in very challenging situations.

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