scholarly journals Bandwidth Extension for Transimpedance Amplifiers

Author(s):  
Omidreza Ghasemi

2012 ◽  
Vol 21 (03) ◽  
pp. 1250021 ◽  
Author(s):  
OMIDREZA GHASEMI

In this paper, double zero-pole cancellation for BandWidth (BW) extension of Transimpedance Amplifiers has been introduced. The effect of parasitic capacitances of the MOS transistor has been reduced using the mentioned approach. The process of zero-pole cancellation to extend the BW of the amplifier has been explained. To demonstrate the feasibility of the technique the transimpedance amplifier has been simulated in a well-known CMOS technology (i.e., 90 nm STMicroelectronics). It achieves 3 dB bandwidths of more than 46 GHz in the presence of 50 fF photodiode capacitance and 5 fF loading capacitance while only dissipating 4.06 mW.



Author(s):  
Hitoshi Yamamoto ◽  
Kong Aik Lee ◽  
Koji Okabe ◽  
Takafumi Koshinaka
Keyword(s):  




Sensors ◽  
2021 ◽  
Vol 21 (10) ◽  
pp. 3455
Author(s):  
Francisco Javier Meca Meca ◽  
Ernesto Martín-Gorostiza ◽  
Miguel Ángel García-Garrido ◽  
David Salido-Monzú

Transimpedance amplifiers (TIA) are widely used for front-end signal conditioning in many optical distance measuring applications in which high accuracy is often required. Small effects due to the real characteristics of the components and the parasitic elements in the circuit board may cause the error to rise to unacceptable levels. In this work we study these effects on the TIA delay time error and deduce analytic expressions, taking into account the trade-off between the uncertainties caused by the delay time instability and by the signal-to-noise ratio. A specific continuous-wave phase-shift case study is shown to illustrate the analysis, and further compared with real measurements. General strategies and conclusions, useful for designers of this kind of system, are extracted too. The study and results show that the delay time thermal stability is a key determinant factor in the measured distance accuracy and, without an adequate design, moderate temperature variations of the TIA can cause extremely high measurement errors.





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