Characterization of Nanocrystals Using Spectroscopic Ellipsometry

GROWTH CHARACTERIZATION OF a Si:H FILMS BY MULTIPLE ANGLE OF INCIDENCE SPECTROSCOPIC ELLIPSOMETRY

Le Journal de Physique Colloques ◽

10.1051/jphyscol:19831052 ◽

1983 ◽

Vol 44 (C10) ◽

pp. C10-247-C10-251

Author(s):

J. Perrin ◽

B. Drevillon

Keyword(s):

Spectroscopic Ellipsometry ◽

Angle Of Incidence ◽

Growth Characterization

Optical characterization of hybrid PEDOT:PSS/Si heterostructures by spectroscopic ellipsometry

Molecular Crystals and Liquid Crystals ◽

10.1080/15421406.2020.1860533 ◽

2021 ◽

Vol 717 (1) ◽

pp. 92-97

Author(s):

O. S. Kondratenko ◽

S. V. Mamykin ◽

T. S. Lunko ◽

I. B. Mamontova ◽

V. R. Romanyuk

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Characterization

Characterization of cubic boron nitride growth using UV-extended real-time spectroscopic ellipsometry: Effect of plasma additions and dynamic substrate bias steps

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1486226 ◽

2002 ◽

Vol 20 (4) ◽

pp. 1395-1407 ◽

Cited By ~ 7

Author(s):

J. A. Zapien ◽

R. W. Collins ◽

R. Messier

Keyword(s):

Boron Nitride ◽

Real Time ◽

Spectroscopic Ellipsometry ◽

Cubic Boron Nitride ◽

Substrate Bias

Characterization of silica xerogel films by variable-angle spectroscopic ellipsometry and infrared spectroscopy

Semiconductor Science and Technology ◽

10.1088/0268-1242/16/9/312 ◽

2001 ◽

Vol 16 (9) ◽

pp. 806-811 ◽

Cited By ~ 18

Author(s):

C Himcinschi ◽

M Friedrich ◽

C Murray ◽

I Streiter ◽

S E Schulz ◽

...

Keyword(s):

Infrared Spectroscopy ◽

Spectroscopic Ellipsometry ◽

Silica Xerogel ◽

Variable Angle ◽

Variable Angle Spectroscopic Ellipsometry ◽

Xerogel Films

Characterization of μc-Si:H/a-Si:H tandem solar cell structures by spectroscopic ellipsometry

Thin Solid Films ◽

10.1016/j.tsf.2013.10.073 ◽

2014 ◽

Vol 571 ◽

pp. 756-761 ◽

Cited By ~ 9

Author(s):

Daisuke Murata ◽

Tetsuya Yuguchi ◽

Hiroyuki Fujiwara

Keyword(s):

Solar Cell ◽

Spectroscopic Ellipsometry ◽

Tandem Solar Cell ◽

Cell Structures

Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants

Thin Solid Films ◽

10.1016/s0040-6090(97)00853-5 ◽

1998 ◽

Vol 313-314 ◽

pp. 394-397 ◽

Cited By ~ 198

Author(s):

R.A Synowicki

Keyword(s):

Oxide Film ◽

Tin Oxide ◽

Spectroscopic Ellipsometry ◽

Indium Tin Oxide ◽

Optical Constants ◽

Film Microstructure

Spectroscopic ellipsometry and FTIR characterization of annealed SiOxNy:H films prepared by PECVD

Optical Materials ◽

10.1016/j.optmat.2021.111693 ◽

2021 ◽

Vol 122 ◽

pp. 111693

Author(s):

Mohammed Boulesbaa

Keyword(s):

Spectroscopic Ellipsometry ◽

Ftir Characterization

Retraction: “Depth Profile Characterization of Spin-Coated Poly(3,4-ethylenedioxythiophene):Poly(styrene sulfonic acid) Films for Thin-Film Solar Cells during Argon Plasma Etching by Spectroscopic Ellipsometry”

Japanese Journal of Applied Physics ◽

10.7567/jjap.55.089201 ◽

2016 ◽

Vol 55 (8) ◽

pp. 089201

Author(s):

Tomohisa Ino ◽

Tatsuya Hayashi ◽

Keiji Ueno ◽

Hajime Shirai

Keyword(s):

Thin Film ◽

Solar Cells ◽

Depth Profile ◽

Plasma Etching ◽

Spectroscopic Ellipsometry ◽

Sulfonic Acid ◽

Argon Plasma ◽

Thin Film Solar Cells ◽

Styrene Sulfonic Acid

Spectroscopic ellipsometry characterization of thin film photovoltaic materials and devices

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) ◽

10.1109/pvsc.2013.6744416 ◽

2013 ◽

Author(s):

Michelle N. Sestak ◽

Li Yan ◽

Celine Eypert

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry ◽

Photovoltaic Materials

Optical characterization of textured SnO2:F layers using spectroscopic ellipsometry

Journal of Applied Physics ◽

10.1063/1.4759054 ◽

2012 ◽

Vol 112 (8) ◽

pp. 083507 ◽

Cited By ~ 10

Author(s):

Masataka Akagawa ◽

Hiroyuki Fujiwara

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Characterization