OCT with a Visible Broadband Light Source Applied to High-Resolution Nondestructive Inspection for Semiconductor Optical Devices
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2008 ◽
Vol 281
(7)
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pp. 1896-1900
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Vol 9
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pp. 2473-2476
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2016 ◽
Vol 55
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pp. 08RE05
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2004 ◽
Vol 34
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pp. 915-918
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Vol E99.C
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pp. 381-384
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2008 ◽
Vol 20
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pp. 2072-2074
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1997 ◽
Vol 68
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pp. 1945-1951
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