The aim of this study is to assess the possibilities of the VNIR (Visible and Near InfraRed) and SWIR (Short Wavelength InfraRed) satellite data for estimating intra-plot patterns of soil electrical resistivity consistent with ground measurements. The methodology is based on optical reflectances that constitute the input variables of random forest, alone or in combination with parameters derived from a digital elevation model (DEM). Over a field located in southwestern France, the results show high level of accuracy for the 0–50 and 0–100 cm soil layers (with R² of 0.69 and 0.59, and a relative RMSE of 18% and 16%, respectively), the performances being lower for the 0–170 cm layer (R² of 0.39, relative RMSE of 20%). The combined use of optical reflectances with parameters derived from the DEM slightly improves the performances, whatever the considered layer. The influence of each reflectance on soil electrical resistivity estimates is finally analyzed, showing that the wavelengths acquired in the SWIR have a relative higher importance than VNIR reflectance.