Energy Saving Smart Illuminating System Implementation Based on Obstacle Environment Presetting

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).

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Characteristics and Application of Temperature-Field Emitters

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100114347 ◽

1975 ◽

Vol 33 ◽

pp. 144-145

Author(s):

N. Tamura ◽

T. Goto ◽

Y. Harada

Keyword(s):

Temperature Field ◽

Electron Microscope ◽

Field Emission ◽

Resolving Power ◽

High Brightness ◽

Field Emitters ◽

Emission Electron ◽

Sufficient Stability ◽

Scanning Electron ◽

Illuminating System

On account of its high brightness, the field emission electron source has the advantage that it provides the conventional electron microscope with highly coherent illuminating system and that it directly improves the, resolving power of the scanning electron microscope. The present authors have reported some results obtained with a 100 kV field emission electron microscope.It has been proven, furthermore, that the tungsten emitter as a temperature field emission source can be utilized with a sufficient stability under a modest vacuum of 10-8 ~ 10-9 Torr. The present paper is concerned with an extension of our study on the characteristics of the temperature field emitters.

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A Newly Designed 650kv Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100101268 ◽

1968 ◽

Vol 26 ◽

pp. 304-305

Author(s):

K. Shiraishi ◽

T. Katsuta ◽

S. Ozasa ◽

H. Todokoro

Keyword(s):

Electron Microscope ◽

High Voltage ◽

Bright Field Image ◽

Bright Field ◽

Push Button ◽

Condenser Lens ◽

High Voltage Generator ◽

Frequency Power ◽

Better Than ◽

Illuminating System

We have recently completed a newly designed 650KV electron microscope. An external view of this advanced instrument is shown in Figure 1. A symmetrical Cockcroft-Walton circuit has been adopted as the high voltage generator. The cathode is heated by high frequency power; a battery is not employed. The high voltage stability is better than 1 x 10-5/min.The sectional diagram of the column shown in Figure 2 is 420mm in diameter and 2750mm in height. The illuminating system consists of a double condenser lens and a magnetic alignment device. Dual deflector assemblies for dark and bright field images, selectable by push button, are built beneath the condenser lens. Two selectable stigmator power supplies are also provided for dark and bright field image operation.

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Optical characteristics of the hitachi HF-2000 cold field-emission TEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100151210 ◽

1993 ◽

Vol 51 ◽

pp. 1076-1077

Author(s):

L. F. Allard ◽

E. Völkl ◽

T. A. Nolan

Keyword(s):

Field Emission ◽

Recent Literature ◽

Electron Gun ◽

High Brightness ◽

Condenser Lens ◽

Illumination System ◽

High Resolution Images ◽

Imaging Mode ◽

Better Than ◽

Illuminating System

The illumination system of the cold field emission (CFE) Hitachi HF-2000 TEM operates with a single condenser lens in normal imaging mode, and with a second condenser lens excited to give the ultra-fine 1 nm probe for microanalysis. The electron gun provides a guaranteed high brightness of better than 7×l08 A/cm2/sr, more than twice the guaranteed brightness of Schottky emission guns. There have been several articles in the recent literature (e.g. refs.) which claim that the geometry of this illumination system yields a total current which is so low that when the beam is spread at low magnifications (say 10 kX), the operator must “keep his eyes glued to the binoculars” in order to see the image. It is also claimed that this illuminating system produces an isoplanatic patch (the area over which image character does not vary significantly) at high magnification which is so small that the instrument is ineffective for recording high resolution images.

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Subjective Time Preference and Willingness to Pay for an Energy-Saving Durable Good

Zeitschrift für Sozialpsychologie ◽

10.1024//0044-3514.32.3.133 ◽

2001 ◽

Vol 32 (3) ◽

pp. 133-141 ◽

Cited By ~ 4

Author(s):

Gerrit Antonides ◽

Sophia R. Wunderink

Keyword(s):

Willingness To Pay ◽

Energy Saving ◽

Subjective Time ◽

Durable Good ◽

Discount Function ◽

Hyperbolic Discount ◽

The One ◽

Two Parameter ◽

Difference Effect ◽

Better Than

Summary: Different shapes of individual subjective discount functions were compared using real measures of willingness to accept future monetary outcomes in an experiment. The two-parameter hyperbolic discount function described the data better than three alternative one-parameter discount functions. However, the hyperbolic discount functions did not explain the common difference effect better than the classical discount function. Discount functions were also estimated from survey data of Dutch households who reported their willingness to postpone positive and negative amounts. Future positive amounts were discounted more than future negative amounts and smaller amounts were discounted more than larger amounts. Furthermore, younger people discounted more than older people. Finally, discount functions were used in explaining consumers' willingness to pay for an energy-saving durable good. In this case, the two-parameter discount model could not be estimated and the one-parameter models did not differ significantly in explaining the data.

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