Characterization of the electrical properties of an InN epilayer using terahertz time-domain spectroscopic ellipsometry
2019 ◽
Vol 58
(SC)
◽
pp. SCCB22
◽
1983 ◽
Vol 44
(C10)
◽
pp. C10-247-C10-251
1990 ◽
Vol 55
(12)
◽
pp. 2933-2939
◽
2021 ◽
Vol 717
(1)
◽
pp. 92-97
2002 ◽
Vol 20
(4)
◽
pp. 1395-1407
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