Combined atomic force microscopy and voltage pulse technique to accurately measure electrostatic force

2016 ◽  
Vol 55 (8S1) ◽  
pp. 08NB05 ◽  
Author(s):  
Eiichi Inami ◽  
Yoshiaki Sugimoto
Keyword(s):  
Atomic Force Microscopy ◽  
Voltage Pulse ◽  
Electrostatic Force ◽  
Pulse Technique ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

Nanostructured Thermoset Composites Containing Conductive TiO2 Nanoparticles

2012 ◽  
Vol 714 ◽  
pp. 147-152 ◽  
Author(s):  
Junkal Gutierrez ◽  
Agnieszka Tercjak ◽  
Iñaki Mondragon
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Properties ◽  
Block Copolymer ◽  
Electrostatic Force ◽  
Sol Gel ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Thermoset Composites ◽  
Atomic Force ◽  
Conductive Properties

Novel transparent multiphase nanostructured thermosetting composites with different block copolymer and sol-gel contents have been developed. Morphology of designed systems has been investigated by atomic force microscopy (AFM). Electrostatic force microscopy (EFM) has been used in order to study the conductive properties of prepared hybrid inorganic/organic nanostructured thermosetting systems. Moreover taking into account the optical properties of TiO2 nanoparticles UV-vis measurements indicate that TiO2 nanoparticles clearly enhance the UV-shielding efficiency of the inorganic/organic nanostructured thermosetting systems without losing high-visible light transparency.

scholarly journals Submolecular Resolution Imaging of Molecules by Atomic Force Microscopy: The Influence of the Electrostatic Force

2016 ◽  
Vol 116 (9) ◽  
Author(s):  
Joost van der Lit ◽  
Francesca Di Cicco ◽  
Prokop Hapala ◽  
Pavel Jelinek ◽  
Ingmar Swart
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

Quantitative Charge Imaging of Silicon Nanocrystals by Atomic Force Microscopy

2002 ◽  
Vol 737 ◽  
Author(s):  
Tao Feng ◽  
Harry A. Atwater
Keyword(s):  
Atomic Force Microscopy ◽  
Nonvolatile Memory ◽  
Electrostatic Force ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Si Nanocrystals ◽  
Nonvolatile Memory Devices ◽  
Quantitative Understanding ◽  
Simulated Images

ABSTRACTQuantitative understanding of charging and discharging of Si nanocrystals in SiO2 films on Si substrate is essential to their application in floating gate nonvolatile memory devices. Charge imaging by atomic force microscopy (AFM) or electrostatic force microscopy (EFM) can provide qualitative information on such system, while a further step is needed. We have developed a generalized method of images, which can solve Poisson equation for multiple dielectric layers, to simulate the charge imaging of Si nanocrystals by non-contact mode AFM under different sample geometries. Simulated images can be compared with experimental images thoroughly to estimate the total amount and distributions of trapped charges, which is also useful in the study of time evolution of charges or dissipation problems.

On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

2018 ◽  
Vol 24 (2) ◽  
pp. 126-131 ◽  
Author(s):  
Sergey Y. Luchkin ◽  
Keith J. Stevenson
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
Electrostatic Force ◽  
Experimental Results ◽  
Kelvin Probe Force Microscopy ◽  
Atomic Force Microscopy Probe ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Potential Sensitivity

AbstractIn this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.

Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy

2003 ◽  
Vol 15 (2) ◽  
pp. S14-S18 ◽  
Author(s):  
Sascha Sadewasser ◽  
Philippe Carl ◽  
Thilo Glatzel ◽  
Martha Ch Lux-Steiner
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Force Microscopy ◽  
Atomic Force
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