The Structure and Power-level Dependences of CMOS RF Power Cell Degradation by Hot-carrier Stress with Load Pull System

2009 ◽  
Author(s):  
C. H. Liu ◽  
Y. K. Su ◽  
R. L. Wang ◽  
C. H. Tu ◽  
Y. Z. Juang
Keyword(s):  
Power Level ◽  
Rf Power ◽  
Pull System ◽  
Hot Carrier ◽  
Power Cell ◽  
Hot Carrier Stress ◽  
Load Pull ◽  
Cmos Rf

Impact of Hot Carrier Stress on RF Power Characteristics of MOSFETs

2006 ◽  
Author(s):  
Sheng-Yi Huang ◽  
Kun-Ming Chen ◽  
Guo-Wei Huang ◽  
Dao-Yen Yang ◽  
Chun-Yen Chang ◽  
...  
Keyword(s):  
Rf Power ◽  
Hot Carrier ◽  
Power Characteristics ◽  
Hot Carrier Stress

Performance degeneration of CMOS RF power cells after hot-carrier and load mismatch stresses

2007 ◽  
Author(s):  
Chien-Hsuan Liu ◽  
Ruey-Lue Wang ◽  
Yan-Kuin Su ◽  
Chih-Ho Tu ◽  
Ying-Zong Juang
Keyword(s):  
Rf Power ◽  
Hot Carrier ◽  
Cmos Rf

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs

2017 ◽  
Vol 74 ◽  
pp. 74-80 ◽  
Author(s):  
Lihua Dai ◽  
Xiaonian Liu ◽  
Mengying Zhang ◽  
Leqing Zhang ◽  
Zhiyuan Hu ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Stress

An Accurate Calibrate-Able Multiharmonic Active Load–Pull System Based on the Envelope Load–Pull Concept

2010 ◽  
Vol 58 (3) ◽  
pp. 656-664 ◽  
Author(s):  
M.S. Hashmi ◽  
A.L. Clarke ◽  
S.P. Woodington ◽  
J. Lees ◽  
J. Benedikt ◽  
...  
Keyword(s):  
Pull System ◽  
Active Load ◽  
Load Pull
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