scholarly journals Testable Design of RF-ICs using BIST Technique

2012 ◽  
Vol 13 (4) ◽  
pp. 491-500
Author(s):  
Yong Kim ◽  
Jae-Min Lee
Keyword(s):  
Testable Design ◽  
Rf Ics

Chip Level Simulation of Substrate Noise Coupling and Interference in RF ICs with CMOS Digital Noise Emulator

2014 ◽  
Vol E97.C (6) ◽  
pp. 546-556
Author(s):  
Naoya AZUMA ◽  
Shunsuke SHIMAZAKI ◽  
Noriyuki MIURA ◽  
Makoto NAGATA ◽  
Tomomitsu KITAMURA ◽  
...  
Keyword(s):  
Substrate Noise ◽  
Noise Coupling ◽  
Substrate Noise Coupling ◽  
Rf Ics

Testable design for cell-based design ASICs and its application to VLSI image signal processor

1993 ◽  
Vol 76 (4) ◽  
pp. 47-56
Author(s):  
Hiroyuki Kawai ◽  
Shin-Ichi Nakagawa ◽  
Masahiko Yoshimoto ◽  
Yasutaka Horiba ◽  
Takuji Ogihara ◽  
...  
Keyword(s):  
Image Signal Processor ◽  
Testable Design ◽  
Signal Processor

Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation

2021 ◽  
Author(s):  
V. A. Niranjan ◽  
D. Neethirajan ◽  
C. Xanthopoulos ◽  
E. De La Rosa ◽  
C. Alleyne ◽  
...  
Keyword(s):  
Time Reduction ◽  
Rf Ics

Testable design of large random access memories

Integration ◽  
1984 ◽  
Vol 2 (4) ◽  
pp. 309-330 ◽  
Author(s):  
Kewal K. Saluja ◽  
Kim Thang Le
Keyword(s):  
Random Access ◽  
Testable Design

Delay Testable Design Using Modified Boundary Scan

2021 ◽  
Vol 24 (7) ◽  
pp. 663-667
Author(s):  
Hiroyuki Yotsuyanagi ◽  
Masaki Hashizume
Keyword(s):  
Boundary Scan ◽  
Testable Design

Testable design of multiple-stage OTA-C filters

2000 ◽  
Vol 49 (5) ◽  
pp. 929-934 ◽  
Author(s):  
Cheng-Chung Hsu ◽  
Wu-Shiung Feng
Keyword(s):  
Testable Design

Wideband RF ICs for power detection and control

2015 ◽  
pp. 1081-1082
Author(s):  
James Wong ◽  
Vladimir Dvorkin
Keyword(s):  
And Control ◽  
Rf Ics
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