An investigation of the optical characteristics of a layer of Ag nanoparticles deposited from an AgNO3 solution on the surface of single-crystal Si is presented. The measurements were carried out using spectroscopic ellipsometry and spectrophotometry at the same tilt angle and sample probe location in a wide spectral range from 200 to 1700 nm. From the obtained experimental data, the parameters of the Drude-Lorentz model and the complex dielectric function were determined, which was compared with the pseudo-dielectric function. Both dependences revealed resonances of a bulk plasmon near the energy E = 3.8 eV, while a localized plasmon was detected in the pseudo-dielectric function at E = 1.65 eV, and in the dielectric function at E = 1.84 eV.
Transition metal dichalcogenides emerged as ideal materials for the investigation of exciton physics. Retrieving the excitonic signature in optical spectra, and tracking their time evolution upon photoexcitation requires appropriate analysis...
Correction for ‘Ultrafast evolution of the complex dielectric function of monolayer WS2 after photoexcitation’ by Stefano Calati et al., Phys. Chem. Chem. Phys., 2021, 23, 22640–22646, DOI: 10.1039/d1cp03437e.
Исследование диэлектрических функций слоя наночастиц Ag на кремнии с помощью спектроэллипсометрии и спектрофотометрии