Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud
2019 ◽
Vol 125
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pp. 045305
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M. Azib
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F. Baudoin
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N. Binaud
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C. Villeneuve-Faure
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G. Teyssedre
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...
2016 ◽
Vol 23
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pp. 705-712
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A. Boularas
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F. Baudoin
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G. Teyssedre
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C. Villeneuve-Faure
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S. Clain
2018 ◽
Vol 51
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pp. 165302
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M Azib
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F Baudoin
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N Binaud
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C Villeneuve-Faure
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F Bugarin
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...
Nikolay V. Ilin
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Dmitry A. Yashunin
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Andrey N. Stepanov
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Alexander I. Smirnov
2021 ◽
Vol 3
(1)
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pp. 014003
Xiangyu Ye
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Mengqi Wang
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Pengfei Wang
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Rui Li
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Maosen Guo
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...
2008 ◽
Vol 21
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pp. 62
2006 ◽
Vol 100
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pp. 074315
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Osamu Takeuchi
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Takaaki Miyakoshi
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Atsushi Taninaka
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Katsunori Tanaka
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Daichi Cho
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...
2007 ◽
Vol 59
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pp. 702-714
E. Shmoylova
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A. Dorfmann
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S. Potapenko
2013 ◽
Vol 13
(5)
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pp. 3550-3553
Hyen-Wook Kang
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Hiroshi Muramatsu
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Young-Soo Kwon
1997 ◽
Vol 188
(2)
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pp. 431-438
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Junfeng Zhang
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Emiko Uchida
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Yoshikimi Uyama
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Yoshito Ikada
2016 ◽
Vol 169
(1)
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pp. 124-132
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Jianlei Cui
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Lijun Yang
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Hui Xie
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Yang Wang
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Xuesong Mei
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...
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