carrier traps
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Author(s):  
E. V. Ivanova ◽  
P. A. Dementev ◽  
M. V. Zamoryanskaya ◽  
D. A. Zakgeim ◽  
D. Yu. Panov ◽  
...  

Author(s):  
Omerfaruk Karadavut ◽  
Joshua W. Kleppinger ◽  
Ritwik Nag ◽  
Sandeep K. Chaudhuri ◽  
Krishna C. Mandal

2021 ◽  
Vol 13 (5) ◽  
pp. 6140-6146
Author(s):  
Saman Jafari ◽  
Yan Zhu ◽  
Fiacre Rougieux ◽  
Joyce Ann T. De Guzman ◽  
Vladimir P. Markevich ◽  
...  

2021 ◽  
Vol 63 (9) ◽  
pp. 1437
Author(s):  
А.С. Комолов ◽  
Э.Ф. Лазнева ◽  
Е.В. Жижин ◽  
Э.К. Алиджанов ◽  
Ю.Д. Лантух ◽  
...  

The morphology of organic semiconductor films of perylenetetracarboxylic acid dianhydride (PTCDA) and perylenetetracarboxylic acid dibenzyl-diimide (N, N`-DBPTCDI) formed by thermal vacuum deposition was studied by atomic force microscopy. It was shown that annealing of films at 420 K leads to rearrangement of their structure and crystallization. The optical absorption spectra of the films under study were used to estimate the optical band gap. The temperature dependence of the dark conductivity of PTCDA and N, N-DBPTCDI films before and after annealing (Т = 420 K) was established. The values of the activation energy of charge carrier traps are determined. The computer simulation of the density of localized states in the band gap of the films studied was carried out using the photoconductivity spectra in the constant photocurrent mode. Model photovoltaic cells based on PTCDA / СuPc and N, N-DBPTCDI / СuPc structures were formed. The kinetics of decay of the interfacial photo-voltage of the cells prepared was measured using pulsed light as an excitation source. On the basis of the performed measurements, the charge carrier mobility values in the investigated semiconductor materials were estimated.


RSC Advances ◽  
2021 ◽  
Vol 11 (54) ◽  
pp. 34095-34100
Author(s):  
Xue Peng ◽  
Yanfei Lv ◽  
Li Fu ◽  
Fei Chen ◽  
Weitao Su ◽  
...  

The presence of cuprous oxide results in band bending at the interface between cuprous phosphide and cuprous oxide, forming carrier traps, which improves the fluorescence properties of cuprous phosphide.


2021 ◽  
Vol 11 (1) ◽  
pp. 241-242
Author(s):  
Yan Zhu ◽  
Mattias Klaus Juhl ◽  
Gianluca Coletti ◽  
Ziv Hameiri

Author(s):  
The Duong ◽  
Huyen Pham ◽  
Yanting Yin ◽  
Jun Peng ◽  
Md Arafat Mahmud ◽  
...  

Defects on perovskite surfaces acting as charge-carrier-traps are a key factor limiting the performance of perovskite solar cells (PSCs). Here we studied the defect passivation effect of three bromide-containing alkylammonium...


Materials ◽  
2020 ◽  
Vol 13 (23) ◽  
pp. 5360
Author(s):  
Shuofan Zhou ◽  
Fan Yu ◽  
Wei Yang ◽  
Zhonglei Li ◽  
Zhaoliang Xing ◽  
...  

This paper aims at investigating the electrical tree characteristics of isotactic polypropylene (iPP)/syndiotactic polypropylene (sPP) blends for thermoplastic cable insulation. PP blended samples with sPP contents of 0, 5, 15, 30, and 45 wt% are prepared, and electrical treeing experiments are implemented under alternating current (AC) voltage at 50, 70, and 90 °C. Experimental results show that with the incorporation of sPP increasing to 15 wt%, the inception time of electrical tree increases by 8.2%. The addition of sPP by 15% distinguishes an excellent performance in inhibiting electrical treeing, which benefits from the ability to promote the fractal dimension and lateral growth of branches. Further increase in sPP loading has a negative effect on the electrical treeing resistance of blended insulation. It is proved by DSC and POM that the addition of sPP promotes the heterogeneous crystallization the of PP matrix, resulting in an increasing density of interfacial regions between crystalline regions, which contains charge carrier traps. Charges injected from an electrode into a polymer are captured by deep traps at the interfacial regions, thus inhibiting the propagation of electrical tree. It is concluded that the modification of crystalline morphology by 15 wt% sPP addition has a great advantage in electrical treeing resistance for PP-based cable insulation.


Author(s):  
Ivana Capan ◽  
Tomislav Brodar ◽  
Yuichi Yamazaki ◽  
Yuya Oki ◽  
Takeshi Ohshima ◽  
...  

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