In this paper, for the first time, changes in the effective mass (EM) of electron and hole with mole fraction are taken into account for extracting the benchmarking parameters of analog/radio frequency (RF) and high-frequency noise performance of junctionless (JL)-Ga[Formula: see text]In[Formula: see text]As/GaAs via simulation. In the JL-Ga[Formula: see text]In[Formula: see text]As/GaAs structure, considering changes in the effective mass with mole fraction is called a with-EM state, while the JL-Ga[Formula: see text]In[Formula: see text]As/GaAs structure without considering the changes in effective mass with mole fraction is called a without-EM state. The simulation results show that, per [Formula: see text], the maximum transconductance in the with-effective mass (EM) state is [Formula: see text] mS/[Formula: see text]m, which is reduced by 8% compared to the without-EM state. The JL-Ga[Formula: see text]In[Formula: see text]As/GaAs device in the with-EM state has the unity gain cutoff frequency of [Formula: see text] GHz, minimum noise figure of [Formula: see text] db, and available associated gain of [Formula: see text] db. The [Formula: see text] and [Formula: see text] parameters in the with-EM state decreased by 10% and 38%, respectively, compared to the without-EM state. Moreover, [Formula: see text] in the with-EM state increased by 65% compared to the without-EM state. Our simulation results indicated that an increase in electron effective mass with the increased [Formula: see text] can limit the analog/RF frequency and high-frequency noise performance of the JL-Ga[Formula: see text]In[Formula: see text]As/GaAs device.