On the Implementation of a Dynamic Direction Modulation System with Vector Modulators

Dynamic directional modulation (DDM) has already proven to be an efficient technique to achieve physical layer security in wireless communications. System architectures based on vector modulators provide a flexible framework to implement synthesis methods that allow us to obtain increased security and/or independent multichannel transmissions. However, the implementation of DDM with vector modulators requires an accurate calibration (amplitude and phase) of every component in the RF path. In this contribution, we study the sensitivity of the response of a DDM system based on commercial vector modulators showing how to correct the nonideal behavior of all the components thanks to the flexibility provided by the vector modulator.

Compton Scattering Artifacts in Electron Excited X-Ray Spectra Measured with a Silicon Drift Detector

Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive X-ray spectrometry. Peaks that result from nonideal behavior in the detector or sample can fool even an experienced microanalyst into believing that they have trace amounts of an element that is not present. Many artifacts, such as the Si escape peak, absorption edges, and coincidence peaks, can be traced to the detector. Others, such as secondary fluorescence peaks and scatter peaks, can be traced to the sample. We have identified a new sample-dependent artifact that we attribute to Compton scattering of energetic X-rays generated in a small feature and subsequently scattered from a low atomic number matrix. It seems likely that this artifact has not previously been reported because it only occurs under specific conditions and represents a relatively small signal. However, with the advent of silicon drift detectors and their utility for trace element analysis, we anticipate that more people will observe it and possibly misidentify it. Though small, the artifact is not inconsequential. Under some conditions, it is possible to mistakenly identify the Compton scatter artifact as approximately 1% of an element that is not present.