Grain Bending at Deformation of the Steel and Arrangement of Internal Stresses

Arrangement of Internal Stresses in Deformed Austenitic Steel is Studied. the Internal Stresses are Determined Using Parameters of Bending Extinction Contours Observing on Electron Microscope Images of the Steel. at the Deformation Degree ε = 14% the Average Internal Stress Values inside Separate Grains with Complex Bending is much Greater than <σ> in a Grain with Simple Bending. the Difference of <σ> at the Deformation Degree ε = 25% in Grains with Simple and Complex Bending is Small. this is Explained by Considerable Relaxation of the Internal Stresses in the Deformed Steel Caused by Appearance at ε > 20% of a Great Number of Microtwin Packages

Ball milling effect on structural and magnetic properties of Ni–Mn–Ga ferromagnetic nanoparticles

The off-stoichiometric Ni2MnGa ferromagnetic alloys are one of the active materials that are of great interest when they are ball milled into nanopowder. These powders are prospective materials for nanosystem applications. However, the properties of the nano-crystalline Ni–Mn–Ga alloys depend strongly on their structure and internal stress, which develop during the milling process. Ni–Mn–Ga nanoparticles were prepared by ball-milling method, and characterized by X-ray diffraction (XRD) and vibrating sample magnetometer (VSM) techniques. The powders are found to be a disordered mixture structure of austenite and martensite. We calculated that an average internal stress is 0.28 to 2.05 MPa stored in the distorted lattice due to milling. Reduction in particle sizes is accompanied by increase of the lattice strain level when the milling time increases. The VSM reveals that magnetic saturation and coercivity decrease with increase of the milling duration. This phenomenon causes deterioration in the hard magnetic properties.

Research on Internal Stress in Electroplated Cu Films on Fe Substrates and Ni Substrates - Based on Electron Theory

Electroplating was employed to prepare Cu films on Fe substrates and Ni substrates. The average internal stresses in Cu films were measured in situ by cantilever beam test. The distribution of the internal stresses in Cu films was investigated. The results show that the average internal stresses and the distributed internal stresses in Cu films decrease abruptly with the increase of film thickness when the films are thinner. The interfacial stresses in Cu films are very large and growth stresses are very small. The average internal stresses in Cu films, which were caused by the adjustment of the electron densities at either side of the interface, were calculated roughly using a modified Thomas–Feimi–Dirac electron theory. For the same substrate and the same film, the theoretical value of the average internal stress in film is about equal to the experimental value. It shows that the theoretical calculation model of internal stress is of accuracy.

STRUCTURAL CHARACTERIZATION OF CO-PRECIPITATED Cd1-xZnxS:Cu CRYSTALS

Structural characterization of Cd 1-x Zn x S : Cu solid solutions were carried out with 0≤x≤1. XRD studies have revealed that the compounds are polycrystalline in nature having either Hexagonal (wurtzite) or Cubic (Zincblende) structure irrespective of their composition. Also the compounds have shown the most preferred reflections due to the plane [101] of CdS(H) and [111] of ZnS(C) in addition to other prominent reflections. The various structural parameters such as lattice constant, average internal stress, micro strain, dislocaion density, grain size, and preferred orientation were correlated with the composition. The lattice constant decreased linearly with the increase in Zn concentration. The sign of internal stress indicated elongational and compressional natures corresponding to hexagonal and cubic phases of CdS respectively. The variation of micro strain appeared to be conjugate when compared to grain size variation, and the variation of dislocation density with the composition showed a higher dislocation density till x=0.4 and then decreased till x=0.8 and then increased. The degree of preferred orientation in mixed Cd 1-x Zn x S : Cu crystals as observed by the maximum peak intensity of CdS(H) and ZnS(C) reflection showed that the degree of preferred orientation remained almost constant till x=0.6 and then increased. The results were explained on the basis of different phases of the compound and the defects related to Zn atoms.

Thin Film Characterization Using the Point-Deflection Method

ABSTRACTThe Point-Deflection Method is a potentially useful technique for measuring the internal stresses of freestanding thin films. By applying a small concentrated transverse load at the center of a pre-stretched film, and measuring the corresponding out-of-plane displacement at appropriate locations, the average internal stress can be readily determined. The load-deflection relationship has been derived for both circular and rectangular shapes. The method involves no additional micromachining in sample preparation and has low sensitivity to the variations in boundary constraints. Its feasibility has been further substantiated with finite element simulations from a variety of perspectives, as well as experimental correlations from the stress measurements of a photomask pellicle film.