2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588)

Simultaneous cryogenic temperature (77 K) and total dose ionizing radiation effects on COTS amplifiers

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960442 ◽

2002 ◽

Cited By ~ 1

Author(s):

D. Guckenberger ◽

D.M. Hiemstra

Keyword(s):

Ionizing Radiation ◽

Total Dose ◽

Cryogenic Temperature ◽

Radiation Effects

Total-dose and single-event-upset (SEU) resistance in advanced SRAMs fabricated on SOI using 0.2 μm design rules

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960447 ◽

2002 ◽

Cited By ~ 3

Author(s):

K. Hirose ◽

H. Saito ◽

M. Akiyama ◽

M. Arakaki ◽

Y. Kuroda ◽

...

Keyword(s):

Total Dose ◽

Single Event Upset ◽

Single Event ◽

Design Rules

Characterization of various SEE hardened power management ICs

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960444 ◽

2002 ◽

Author(s):

B.P. Alaskiewicz ◽

B.R. Doyle ◽

W.H. Newman

Keyword(s):

Power Management

Responses of radiation-hardened power MOSFETs to neutrons

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960465 ◽

2002 ◽

Cited By ~ 3

Author(s):

J.E. Gillberg ◽

D.I. Burton ◽

J.L. Titus ◽

C.F. Wheatley ◽

N. Hubbard

Keyword(s):

Power Mosfets ◽

Radiation Hardened

Photon and neutron responses of optical absorption dosimeters used at SLAC

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960463 ◽

2002 ◽

Author(s):

X.S. Mao ◽

J.C. Liu ◽

G. Lum

Keyword(s):

Optical Absorption

Single event upset test results on a prescaler fabricated in IBM's 5HP silicon germanium heterojunction bipolar transistors BiCMOS technology

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960469 ◽

2002 ◽

Cited By ~ 6

Author(s):

R.A. Reed ◽

P.W. Marshall ◽

H. Ainspan ◽

C.J. Marshall ◽

H.S. Kim ◽

...

Keyword(s):

Heterojunction Bipolar Transistors ◽

Silicon Germanium ◽

Bipolar Transistors ◽

Test Results ◽

Single Event Upset ◽

Single Event ◽

Bicmos Technology

Total-dose tolerance of the commercial Taiwan Semiconductor Manufacturing Company (TSMC) 0.35-μm CMOS process

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960453 ◽

2002 ◽

Cited By ~ 3

Author(s):

R.C. Lacoe ◽

J.V. Osborn ◽

D.C. Mayer ◽

S. Brown ◽

J. Gambles

Keyword(s):

Total Dose ◽

Semiconductor Manufacturing ◽

Cmos Process ◽

Manufacturing Company ◽

Dose Tolerance

High-speed data transmission for spaceborne applications

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960452 ◽

2002 ◽

Cited By ~ 3

Author(s):

J.M. Benedetto ◽

A. Oliver

Keyword(s):

Data Transmission ◽

High Speed ◽

High Speed Data ◽

Speed Data Transmission

Comparative testing of ADSP-21020 digital signal processors from multiple vendors

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960443 ◽

2002 ◽

Cited By ~ 1

Author(s):

P. Duggan ◽

S. Sampson ◽

R. Burnell ◽

R. Koga ◽

P. Yu ◽

...

Keyword(s):

Digital Signal ◽

Digital Signal Processors ◽

Comparative Testing ◽

Signal Processors

A compendium of single event transient data

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960460 ◽

2002 ◽

Cited By ~ 5

Author(s):

M.W. Savage ◽

T. Turflinger ◽

J.W. Howard ◽

S. Buchner

Keyword(s):

Single Event ◽

Single Event Transient ◽

Transient Data

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Simultaneous cryogenic temperature (77 K) and total dose ionizing radiation effects on COTS amplifiers

Total-dose and single-event-upset (SEU) resistance in advanced SRAMs fabricated on SOI using 0.2 μm design rules

Characterization of various SEE hardened power management ICs

Responses of radiation-hardened power MOSFETs to neutrons

Photon and neutron responses of optical absorption dosimeters used at SLAC

Single event upset test results on a prescaler fabricated in IBM's 5HP silicon germanium heterojunction bipolar transistors BiCMOS technology

Total-dose tolerance of the commercial Taiwan Semiconductor Manufacturing Company (TSMC) 0.35-μm CMOS process

High-speed data transmission for spaceborne applications

Comparative testing of ADSP-21020 digital signal processors from multiple vendors

A compendium of single event transient data

Export Citation Format

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Simultaneous cryogenic temperature (77 K) and total dose ionizing radiation effects on COTS amplifiers

Total-dose and single-event-upset (SEU) resistance in advanced SRAMs fabricated on SOI using 0.2 μm design rules

Characterization of various SEE hardened power management ICs

Responses of radiation-hardened power MOSFETs to neutrons

Photon and neutron responses of optical absorption dosimeters used at SLAC

Single event upset test results on a prescaler fabricated in IBM's 5HP silicon germanium heterojunction bipolar transistors BiCMOS technology

Total-dose tolerance of the commercial Taiwan Semiconductor Manufacturing Company (TSMC) 0.35-μm CMOS process

High-speed data transmission for spaceborne applications

Comparative testing of ADSP-21020 digital signal processors from multiple vendors

A compendium of single event transient data

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588)
Latest Publications