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Advances in Metrology for X-Ray and EUV Optics IX
Latest Publications
TOTAL DOCUMENTS
20
(FIVE YEARS 20)
H-INDEX
0
(FIVE YEARS 0)
Published By SPIE
9781510637900, 9781510637917
Latest Documents
Most Cited Documents
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Front Matter: Volume 11492
Advances in Metrology for X-Ray and EUV Optics IX
◽
10.1117/12.2581593
◽
2020
◽
Keyword(s):
Matter Volume
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A test bench of X-ray optics for next-generation high-energy high-flux X-ray beamlines
Advances in Metrology for X-Ray and EUV Optics IX
◽
10.1117/12.2570154
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2020
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Author(s):
Hirokatsu Yumoto
◽
Haruhiko Ohashi
◽
Hiroshi Yamazaki
◽
Yasunori Senba
◽
Takahisa Koyama
◽
...
Keyword(s):
Test Bench
◽
High Energy
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High Flux
◽
Next Generation
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Ray Optics
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X Ray
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Single-shot speckle tracking method based on wavelet transform and multi-resolution analysis
Advances in Metrology for X-Ray and EUV Optics IX
◽
10.1117/12.2569135
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2020
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Author(s):
Zhi Qiao
◽
Xianbo Shi
◽
Lahsen Assoufid
Keyword(s):
Wavelet Transform
◽
Speckle Tracking
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Single Shot
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Tracking Method
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Multi Resolution Analysis
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Resolution Analysis
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Reflective optics for EUV/x-ray sources at Thales SESO: possibilities and perspectives
Advances in Metrology for X-Ray and EUV Optics IX
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10.1117/12.2570604
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2020
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Author(s):
Luca PEVERINI
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Henry Guadalupi
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Thomas Michel
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Sylvain Perrin
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Remy Neviere
◽
...
Keyword(s):
X Ray
◽
Reflective Optics
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Performance evaluation of JTEC coordinate measuring machine
Advances in Metrology for X-Ray and EUV Optics IX
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10.1117/12.2570370
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2020
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Author(s):
Hiroki Nakamori
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Masahiko Kanaoka
Keyword(s):
Performance Evaluation
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Coordinate Measuring Machine
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Measuring Machine
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X-ray wavefront characterization with grating interferometry using an x-ray microfocus laboratory source
Advances in Metrology for X-Ray and EUV Optics IX
◽
10.1117/12.2576152
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2020
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Author(s):
Zhao Shuai
◽
Keyi Wang
◽
Guangyu Cheng
◽
Yuan Shen
◽
Yushan Wang
◽
...
Keyword(s):
X Ray
◽
Laboratory Source
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In-situ metrology for adaptive x-ray optics with an in-position LTP system in the soft x-ray beamline
Advances in Metrology for X-Ray and EUV Optics IX
◽
10.1117/12.2570538
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2020
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Author(s):
Shang-Wei Lin
◽
Duan-Jen Wang
◽
Chih-Yu Hua
◽
Hok-Sum Fung
◽
Ming-Ying Hsu
◽
...
Keyword(s):
Ray Optics
◽
X Ray
◽
In Situ Metrology
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Characterization of groove density variation of VLS gratings with ALS XROL LTP-II in different operation modes
Advances in Metrology for X-Ray and EUV Optics IX
◽
10.1117/12.2568705
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2020
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Author(s):
Ian Lacey
◽
Valeriy V. Yashchuk
Keyword(s):
Density Variation
◽
Operation Modes
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Improvement on x-ray beam image by plane mirrors and x-ray windows for a modern x-ray beamline aiming at next generation light source
Advances in Metrology for X-Ray and EUV Optics IX
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10.1117/12.2570168
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2020
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Author(s):
Yasunori Senba
◽
Hirokatsu Yumoto
◽
Takahisa Koyama
◽
Takanori Miura
◽
Hikaru Kishimoto
◽
...
Keyword(s):
Light Source
◽
Next Generation
◽
X Ray
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Beam Image
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Development of shape measurement system for high precision Wolter mandrel
Advances in Metrology for X-Ray and EUV Optics IX
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10.1117/12.2568929
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2020
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Author(s):
Takehiro Kume
◽
Hirokazu Hashizume
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Kentarou Hiraguri
◽
Yusuke Matsuzawa
◽
Yoichi Imamura
◽
...
Keyword(s):
High Precision
◽
Measurement System
◽
Shape Measurement
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