Advances in Metrology for X-Ray and EUV Optics IX
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9781510637900, 9781510637917
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A test bench of X-ray optics for next-generation high-energy high-flux X-ray beamlines

2020 ◽  
Author(s):  
Hirokatsu Yumoto ◽  
Haruhiko Ohashi ◽  
Hiroshi Yamazaki ◽  
Yasunori Senba ◽  
Takahisa Koyama ◽  
...  
Keyword(s):  
Test Bench ◽  
High Energy ◽  
High Flux ◽  
Next Generation ◽  
Ray Optics ◽  
X Ray

Reflective optics for EUV/x-ray sources at Thales SESO: possibilities and perspectives

2020 ◽  
Author(s):  
Luca PEVERINI ◽  
Henry Guadalupi ◽  
Thomas Michel ◽  
Sylvain Perrin ◽  
Remy Neviere ◽  
...  
Keyword(s):  
X Ray ◽  
Reflective Optics

X-ray wavefront characterization with grating interferometry using an x-ray microfocus laboratory source

2020 ◽  
Author(s):  
Zhao Shuai ◽  
Keyi Wang ◽  
Guangyu Cheng ◽  
Yuan Shen ◽  
Yushan Wang ◽  
...  
Keyword(s):  
X Ray ◽  
Laboratory Source

In-situ metrology for adaptive x-ray optics with an in-position LTP system in the soft x-ray beamline

2020 ◽  
Author(s):  
Shang-Wei Lin ◽  
Duan-Jen Wang ◽  
Chih-Yu Hua ◽  
Hok-Sum Fung ◽  
Ming-Ying Hsu ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
In Situ Metrology

Improvement on x-ray beam image by plane mirrors and x-ray windows for a modern x-ray beamline aiming at next generation light source

2020 ◽  
Author(s):  
Yasunori Senba ◽  
Hirokatsu Yumoto ◽  
Takahisa Koyama ◽  
Takanori Miura ◽  
Hikaru Kishimoto ◽  
...  
Keyword(s):  
Light Source ◽  
Next Generation ◽  
X Ray ◽  
Beam Image

Development of shape measurement system for high precision Wolter mandrel

2020 ◽  
Author(s):  
Takehiro Kume ◽  
Hirokazu Hashizume ◽  
Kentarou Hiraguri ◽  
Yusuke Matsuzawa ◽  
Yoichi Imamura ◽  
...  
Keyword(s):  
High Precision ◽  
Measurement System ◽  
Shape Measurement
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