Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03
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102

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Published By IEEE

0769519512

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

User-level implementation of checkpointing for multithreaded applications on Windows NT

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 ◽

10.1109/ats.2003.1250869 ◽

2003 ◽

Author(s):

Jin-Min Yang ◽

Da-Fang Zhang ◽

Xue-Dong Yang

Keyword(s):

Windows Nt

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Error detection and correction in VLSI systems by online testing and retrying

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 ◽

10.1109/ats.2003.1250873 ◽

2003 ◽

Author(s):

Jian-Hui Jiang

Keyword(s):

Error Detection ◽

Online Testing ◽

Error Detection And Correction

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March SL: a test for all static linked memory faults

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 ◽

10.1109/ats.2003.1250839 ◽

2003 ◽

Cited By ~ 3

Author(s):

Hamdioui ◽

Al-Ars ◽

van de Goor ◽

Rodgers

Keyword(s):

Memory Faults

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On-chip short-time interval measurement for high-speed signal timing characterization

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 ◽

10.1109/ats.2003.1250831 ◽

2003 ◽

Author(s):

Tian Xia ◽

Jien-Chung Lo

Keyword(s):

High Speed ◽

Signal Timing ◽

Time Interval ◽

Short Time Interval ◽

Interval Measurement ◽

Time Interval Measurement ◽

On Chip ◽

Short Time

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Efficiency analysis & safety assessment of automatic testing for safety-critical software [railway control

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 ◽

10.1109/ats.2003.1250792 ◽

2003 ◽

Author(s):

Fangmei Wu ◽

Lei Huang

Keyword(s):

Safety Assessment ◽

Efficiency Analysis ◽

Automatic Testing ◽

Safety Critical

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Test pattern length required to reach the desired fault coverage

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 ◽

10.1109/ats.2003.1250878 ◽

2003 ◽

Author(s):

Hirase

Keyword(s):

Test Pattern ◽

Fault Coverage ◽

Pattern Length

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Issues related to the formulation of DFT solution for analog circuit test using equivalent fault analysis

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 ◽

10.1109/ats.2003.1250795 ◽

2003 ◽

Cited By ~ 1

Author(s):

Wong

Keyword(s):

Analog Circuit ◽

Fault Analysis

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Improving test quality of scan-based BIST by scan chain partitioning

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 ◽

10.1109/ats.2003.1250774 ◽

2003 ◽

Author(s):

Dong Xiang ◽

Ming-Jing Chen ◽

Jia-Guang Sun ◽

Fujiwara

Keyword(s):

Test Quality ◽

Scan Chain

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Automated test model generation from switch level custom circuits

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 ◽

10.1109/ats.2003.1250807 ◽

2003 ◽

Author(s):

Abadir ◽

Zeng ◽

Pyron ◽

Zhu

Keyword(s):

Model Generation ◽

Test Model ◽

Automated Test

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Property classification for functional verification based on CDFG

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 ◽

10.1109/ats.2003.1250871 ◽

2003 ◽

Author(s):

Ming Zhu ◽

Jinian Bian ◽

Weimin Wu ◽

Hongxi Xue

Keyword(s):

Functional Verification

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Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

User-level implementation of checkpointing for multithreaded applications on Windows NT

Error detection and correction in VLSI systems by online testing and retrying

March SL: a test for all static linked memory faults

On-chip short-time interval measurement for high-speed signal timing characterization

Efficiency analysis & safety assessment of automatic testing for safety-critical software [railway control

Test pattern length required to reach the desired fault coverage

Issues related to the formulation of DFT solution for analog circuit test using equivalent fault analysis

Improving test quality of scan-based BIST by scan chain partitioning

Automated test model generation from switch level custom circuits

Property classification for functional verification based on CDFG

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03
Latest Publications