32nd European Solid-State Device Research Conference
Latest Publications

TOTAL DOCUMENTS

161

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

8890084782

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Three-dimensional Simulation of the Channel Stop Implant Effects in Sub-quarter Micron PMOS Transistors

32nd European Solid-State Device Research Conference ◽

10.1109/essderc.2002.194938 ◽

2002 ◽

Cited By ~ 2

Author(s):

A. Burenkov ◽

J. Lorenz

Keyword(s):

Three Dimensional ◽

Dimensional Simulation

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UIS-Failure of DMOS Power Transistors

32nd European Solid-State Device Research Conference ◽

10.1109/essderc.2002.194967 ◽

2002 ◽

Cited By ~ 3

Author(s):

A.I. Deckelmann ◽

G. Wachutka ◽

F. Hirler ◽

J. Krumrey

Keyword(s):

Power Transistors

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Metal Rings as Quantum Bits

32nd European Solid-State Device Research Conference ◽

10.1109/essderc.2002.195006 ◽

2002 ◽

Author(s):

C. Kerner ◽

W. Magnus ◽

W. Schoenmaker

Keyword(s):

Quantum Bits ◽

Metal Rings

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Highly Extendible Memory Cell Architecture for Reliable Data Retention Time for 0.10mm Technology Node and beyond

32nd European Solid-State Device Research Conference ◽

10.1109/essderc.2002.194995 ◽

2002 ◽

Cited By ~ 2

Author(s):

J. Lee ◽

C. Cho ◽

J. Lee ◽

S. Shin ◽

J.-W. Lee ◽

...

Keyword(s):

Retention Time ◽

Memory Cell ◽

Reliable Data ◽

Data Retention ◽

Technology Node ◽

Cell Architecture

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Investigation on Convergence and Stability of Self-Consistent Monte Carlo Device Simulations

32nd European Solid-State Device Research Conference ◽

10.1109/essderc.2002.194902 ◽

2002 ◽

Cited By ~ 1

Author(s):

R. Clerc ◽

P. Palestri ◽

A. Abramo

Keyword(s):

Monte Carlo ◽

Convergence And Stability ◽

Self Consistent

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At the Interface between Technology and Biology

32nd European Solid-State Device Research Conference ◽

10.1109/essderc.2002.194868 ◽

2002 ◽

Author(s):

N. Manaresi ◽

G. Medoro ◽

M. Tartagni ◽

L. Altomare ◽

R. Guerrieri

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Impact of ALCVD and PVD Titanium Nitride Deposition on Metal Gate Capacitors

32nd European Solid-State Device Research Conference ◽

10.1109/essderc.2002.194998 ◽

2002 ◽

Cited By ~ 7

Author(s):

G. Lujan ◽

T. Schram ◽

L. Pantisano ◽

J. Hooker ◽

S. Kubicek ◽

...

Keyword(s):

Titanium Nitride ◽

Metal Gate

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Extraction Method for the Impact-Ionization Multiplication Factor in Silicon at Large Operating Temperatures

32nd European Solid-State Device Research Conference ◽

10.1109/essderc.2002.194911 ◽

2002 ◽

Cited By ~ 9

Author(s):

E. Gnani ◽

S. Reggiani ◽

M. Rudan ◽

G. Baccarani

Keyword(s):

Extraction Method ◽

Impact Ionization ◽

Multiplication Factor ◽

Operating Temperatures ◽

The Impact

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Performance and Reliability of High Density Flash EEPROMs under CHISEL Programming Operation

32nd European Solid-State Device Research Conference ◽

10.1109/essderc.2002.194941 ◽

2002 ◽

Author(s):

S. Mahapatra ◽

S. Shukuri ◽

J. Bude

Keyword(s):

High Density

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Identification of Critical Parameters for Plasma Process-Induced Damage in 130 and 100 nm CMOS Technologies

32nd European Solid-State Device Research Conference ◽

10.1109/essderc.2002.194922 ◽

2002 ◽

Author(s):

G. Van den Bosch ◽

B. De Jaeger ◽

Z. Tokei ◽

G. Groeseneken

Keyword(s):

Critical Parameters ◽

Plasma Process

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32nd European Solid-State Device Research ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Three-dimensional Simulation of the Channel Stop Implant Effects in Sub-quarter Micron PMOS Transistors

UIS-Failure of DMOS Power Transistors

Metal Rings as Quantum Bits

Highly Extendible Memory Cell Architecture for Reliable Data Retention Time for 0.10mm Technology Node and beyond

Investigation on Convergence and Stability of Self-Consistent Monte Carlo Device Simulations

At the Interface between Technology and Biology

Impact of ALCVD and PVD Titanium Nitride Deposition on Metal Gate Capacitors

Extraction Method for the Impact-Ionization Multiplication Factor in Silicon at Large Operating Temperatures

Performance and Reliability of High Density Flash EEPROMs under CHISEL Programming Operation

Identification of Critical Parameters for Plasma Process-Induced Damage in 130 and 100 nm CMOS Technologies

32nd European Solid-State Device Research Conference
Latest Publications