2017 International Conference of Microelectronic Test Structures (ICMTS)

Electromechanical testing of ZnO thin films under high uniaxial strain

2017 International Conference of Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2017.7954261 ◽

2017 ◽

Author(s):

Romain Tuyaerts ◽

Jean-Pierre Raskin ◽

Joris Proost

Keyword(s):

Thin Films ◽

Uniaxial Strain ◽

Zno Thin Films

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Detailed characterization and critical discussion of series resistance in graphene-metal contacts

2017 International Conference of Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2017.7954259 ◽

2017 ◽

Cited By ~ 4

Author(s):

Stefano Venica ◽

Francesco Driussi ◽

Amit Gahoi ◽

Vikram Passi ◽

Pierpaolo Palestri ◽

...

Keyword(s):

Series Resistance ◽

Critical Discussion ◽

Metal Contacts ◽

Detailed Characterization

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High voltage MOSFETs integration on advanced CMOS technology: Characterization of thick gate oxides incorporating high k metal gate stack from logic core process

2017 International Conference of Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2017.7954274 ◽

2017 ◽

Cited By ~ 1

Author(s):

Dann Morillon ◽

Franck Julien ◽

Jean Coignus ◽

Alain Toffoli ◽

Loic Welter ◽

...

Keyword(s):

High Voltage ◽

Cmos Technology ◽

Metal Gate ◽

Gate Stack ◽

Gate Oxides ◽

High K

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DC and RF characterization of RF MOSFET embedding structure

2017 International Conference of Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2017.7954273 ◽

2017 ◽

Author(s):

Atsushi Takeshige ◽

Kosuke Katayama ◽

Shuhei Amakawa ◽

Kyoya Takano ◽

Takeshi Yoshida ◽

...

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Characterization and monitoring structures for robustness against cyclic thermomechanical stress: Design and influence of Ti-Al(Cu) layer scheme

2017 International Conference of Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2017.7954255 ◽

2017 ◽

Author(s):

Alexander Mann ◽

Henning Lohmeyer ◽

Yvonne Joseph

Keyword(s):

Thermomechanical Stress

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Test structures for studying flexible interconnect supported by carbon nanotube scaffolds

2017 International Conference of Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2017.7954256 ◽

2017 ◽

Cited By ~ 1

Author(s):

Di Jiang ◽

Shuangxi Sun ◽

Michael Edwards ◽

Kjell Jeppson

Keyword(s):

Carbon Nanotube ◽

Flexible Interconnect

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Design of a Broadband CMOS RF Power Amplifier to establish device-circuit aging correlations

2017 International Conference of Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2017.7954272 ◽

2017 ◽

Cited By ~ 2

Author(s):

E. Barajas ◽

D. Mateo ◽

X. Aragones ◽

A. Crespo-Yepes ◽

R. Rodriguez ◽

...

Keyword(s):

Power Amplifier ◽

Rf Power ◽

Rf Power Amplifier ◽

Circuit Aging ◽

Cmos Rf

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Variability of Low Frequency Noise and mismatch in enclosed-gate and standard nMOSFETs

2017 International Conference of Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2017.7954285 ◽

2017 ◽

Cited By ~ 4

Author(s):

Matthias Bucher ◽

Aristeidis Nikolaou ◽

Nikolaos Mavredakis ◽

Nikolaos Makris ◽

Mathieu Coustans ◽

...

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise

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Novel C-V measurements based method for the extraction of GaN buffer layer residual doping level in HEMT

2017 International Conference of Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2017.7954287 ◽

2017 ◽

Cited By ~ 1

Author(s):

Iliass Nifa ◽

Charles Leroux ◽

Alphonse Torres ◽

Matthew Charles ◽

Gilles Reimbold ◽

...

Keyword(s):

Buffer Layer ◽

Doping Level ◽

Gan Buffer Layer

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Input capacitance determination of power MOSFETs from switching trajectories

2017 International Conference of Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2017.7954270 ◽

2017 ◽

Cited By ~ 1

Author(s):

Kazuki Oishi ◽

Michihiro Shintani ◽

Masayuki Hiromoto ◽

Takashi Sato

Keyword(s):

Power Mosfets ◽

Input Capacitance

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2017 International Conference of Microelectronic Test Structures (ICMTS)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Electromechanical testing of ZnO thin films under high uniaxial strain

Detailed characterization and critical discussion of series resistance in graphene-metal contacts

High voltage MOSFETs integration on advanced CMOS technology: Characterization of thick gate oxides incorporating high k metal gate stack from logic core process

DC and RF characterization of RF MOSFET embedding structure

Characterization and monitoring structures for robustness against cyclic thermomechanical stress: Design and influence of Ti-Al(Cu) layer scheme

Test structures for studying flexible interconnect supported by carbon nanotube scaffolds

Design of a Broadband CMOS RF Power Amplifier to establish device-circuit aging correlations

Variability of Low Frequency Noise and mismatch in enclosed-gate and standard nMOSFETs

Novel C-V measurements based method for the extraction of GaN buffer layer residual doping level in HEMT

Input capacitance determination of power MOSFETs from switching trajectories

Export Citation Format

2017 International Conference of Microelectronic Test Structures (ICMTS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Electromechanical testing of ZnO thin films under high uniaxial strain

Detailed characterization and critical discussion of series resistance in graphene-metal contacts

High voltage MOSFETs integration on advanced CMOS technology: Characterization of thick gate oxides incorporating high k metal gate stack from logic core process

DC and RF characterization of RF MOSFET embedding structure

Characterization and monitoring structures for robustness against cyclic thermomechanical stress: Design and influence of Ti-Al(Cu) layer scheme

Test structures for studying flexible interconnect supported by carbon nanotube scaffolds

Design of a Broadband CMOS RF Power Amplifier to establish device-circuit aging correlations

Variability of Low Frequency Noise and mismatch in enclosed-gate and standard nMOSFETs

Novel C-V measurements based method for the extraction of GaN buffer layer residual doping level in HEMT

Input capacitance determination of power MOSFETs from switching trajectories

2017 International Conference of Microelectronic Test Structures (ICMTS)
Latest Publications