Applications for Machine Learning in Semiconductor Manufacturing

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9421052 ◽

2021 ◽

Author(s):

Richard Burch ◽

Luke Merrick ◽

Qing Zhu ◽

Tomonori Honda ◽

Jeff David

Keyword(s):

Machine Learning ◽

Semiconductor Manufacturing

Download Full-text

IEEE Transactions on Semiconductor Manufacturing CALL FOR PAPERS for Special Issue on Process-Level Machine Learning Applications in Semiconductor Manufacturing

IEEE Transactions on Electron Devices ◽

10.1109/ted.2021.3087043 ◽

2021 ◽

Vol 68 (7) ◽

pp. 3720-3720

Keyword(s):

Machine Learning ◽

Semiconductor Manufacturing ◽

Special Issue ◽

Machine Learning Applications ◽

Download Full-text

IEEE Transactions on Semiconductor Manufacturing CALL FOR PAPERS for Special Issue on Process-Level Machine Learning Applications in Semiconductor Manufacturing

IEEE Electron Device Letters ◽

10.1109/led.2021.3089392 ◽

2021 ◽

Vol 42 (7) ◽

pp. 1099-1099

Keyword(s):

Machine Learning ◽

Semiconductor Manufacturing ◽

Special Issue ◽

Machine Learning Applications ◽

Download Full-text

Machine Learning Approaches Optimizing Semiconductor Manufacturing Processes

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9420955 ◽

2021 ◽

Author(s):

Tsuyoshi Moriya

Keyword(s):

Machine Learning ◽

Semiconductor Manufacturing ◽

Manufacturing Processes ◽

Learning Approaches

Download Full-text

Integrated optimization of semiconductor manufacturing: A machine learning approach

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401531 ◽

2012 ◽

Author(s):

Nathan Kupp ◽

Yiorgos Makris

Keyword(s):

Machine Learning ◽

Semiconductor Manufacturing ◽

Learning Approach ◽

Integrated Optimization ◽

Machine Learning Approach

Download Full-text

Data Analytics and Machine Learning for Design-Process-Yield Optimization in Electronic Design Automation and IC semiconductor manufacturing

2017 China Semiconductor Technology International Conference (CSTIC) ◽

10.1109/cstic.2017.7919774 ◽

2017 ◽

Author(s):

Luigi Capodieci

Keyword(s):

Machine Learning ◽

Design Process ◽

Design Automation ◽

Semiconductor Manufacturing ◽

Data Analytics ◽

Electronic Design Automation ◽

Process Yield ◽

Yield Optimization ◽

Electronic Design

Download Full-text

2107 Adaptive Lot Release Using Genetics Based Machine Learning in a Semiconductor Manufacturing System

The Proceedings of Manufacturing Systems Division Conference ◽

10.1299/jsmemsd.2006.31 ◽

2006 ◽

Vol 2006 (0) ◽

pp. 31-32 ◽

Author(s):

Nobutada FUJII ◽

Motohiro KOBAYASHI ◽

Kanji UEDA

Keyword(s):

Machine Learning ◽

Semiconductor Manufacturing ◽

Manufacturing System

Download Full-text

IEEE Transactions on Semiconductor Manufacturing CALL FOR PAPERS for Special Issue on Process-Level Machine Learning Applications in Semiconductor Manufacturing

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2021.3083343 ◽

2021 ◽

Vol 21 (2) ◽

pp. 286-286

Keyword(s):

Machine Learning ◽

Semiconductor Manufacturing ◽

Special Issue ◽

Machine Learning Applications ◽

Download Full-text

Application of machine learning techniques to semiconductor manufacturing

10.1117/12.21147 ◽

1990 ◽

Author(s):

Keki B. Irani ◽

Jie Cheng ◽

Usama M. Fayyad ◽

Zhaogang Qian

Keyword(s):

Machine Learning ◽

Semiconductor Manufacturing ◽

Machine Learning Techniques ◽

Learning Techniques

Download Full-text

Machine Learning for VLSI Chip Testing and Semiconductor Manufacturing Process Monitoring and Improvement

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_8 ◽

2019 ◽

pp. 233-263

Author(s):

Jinjun Xiong ◽

Yada Zhu ◽

Jingrui He

Keyword(s):

Machine Learning ◽

Process Monitoring ◽

Manufacturing Process ◽

Semiconductor Manufacturing ◽

Vlsi Chip ◽

Download Full-text

Data Mining and Support Vector Regression Machine Learning in Semiconductor Manufacturing to Improve Virtual Metrology

2013 46th Hawaii International Conference on System Sciences ◽

10.1109/hicss.2013.163 ◽

2013 ◽

Author(s):

Benjamin Lenz ◽

Bernd Barak

Keyword(s):

Machine Learning ◽

Data Mining ◽

Support Vector Regression ◽

Semiconductor Manufacturing ◽

Support Vector ◽

Virtual Metrology

Download Full-text