2017 17th International Workshop on Junction Technology (IWJT)
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9784863486263
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The impact of hetero-junction and oxide-interface traps on the performance of InAs/Si tunnel FETs

2017 ◽  
Author(s):  
Andreas Schenk ◽  
Saurabh Sant ◽  
Kirsten Moselund ◽  
Heike Riel
Keyword(s):  
Interface Traps ◽  
Oxide Interface ◽  
Tunnel Fets ◽  
The Impact

Ion implantation technique for conductivity control of GaN

2017 ◽  
Author(s):  
Tetsuo Narita ◽  
Keita Kataoka ◽  
Masakazu Kanechika ◽  
Tetsu Kachi ◽  
Tsutomu Uesugi
Keyword(s):  
Ion Implantation ◽  
Implantation Technique

Ultra-low (1.2×10−9 Ωcm2) p-Si0.55Ge0.45 contact resistivity (ρc) using nanosecond laser anneal for 7nm nodes and beyond

2017 ◽  
Author(s):  
Chih-Yang Chang ◽  
Fareen Adeni Khaja ◽  
Kelly E Hollar ◽  
K. V. Rao ◽  
Christopher Lazik ◽  
...  
Keyword(s):  
Contact Resistivity ◽  
Nanosecond Laser ◽  
Laser Anneal

Formation of n-type Ge on insulator by low-temperature Sb-induced layer exchange crystallization

2017 ◽  
Author(s):  
Hongmiao Gao ◽  
Rikuta Aoki ◽  
Masaya Sasaki ◽  
Masanobu Miyao ◽  
Taizoh Sadoh
Keyword(s):  
Low Temperature

2D carrier profiles by SSRM and TCAD for root cause analysis of low Vt PFET

2017 ◽  
Author(s):  
J. N. Nxumalo ◽  
Y. Y. Wang ◽  
R. Krishnasamy ◽  
A. Katnani
Keyword(s):  
Root Cause Analysis ◽  
Cause Analysis ◽  
Root Cause
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