The impact of hetero-junction and oxide-interface traps on the performance of InAs/Si tunnel FETs

2017 ◽  
Author(s):  
Andreas Schenk ◽  
Saurabh Sant ◽  
Kirsten Moselund ◽  
Heike Riel
Keyword(s):  
Interface Traps ◽  
Oxide Interface ◽  
Tunnel Fets ◽  
The Impact

scholarly journals Impact of Interface Traps on Direct and Alternating Current in Tunneling Field-Effect Transistors

2015 ◽  
Vol 2015 ◽  
pp. 1-14
Author(s):  
Zhi Jiang ◽  
Yiqi Zhuang ◽  
Cong Li ◽  
Ping Wang ◽  
Yuqi Liu
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Great Influence ◽  
Peak Shift ◽  
Flat Band ◽  
Interface Traps ◽  
Oxide Interface ◽  
Band Shift ◽  
Simulation Tools ◽  
The Impact

We demonstrate the impact of semiconductor/oxide interface traps (ITs) on the DC and AC characteristics of tunnel field-effect transistors (TFETs). Using the Sentaurus simulation tools, we show the impacts of trap density distribution and trap type on the n-type double gate- (DG-) TFET. The results show that the donor-type and acceptor-type ITs have the great influence on DC characteristic at midgap. Donor-like and acceptor-like ITs have different mechanism of the turn-on characteristics. The flat band shift changes obviously and differently in the AC analysis, which results in contrast of peak shift of Miller capacitorCgdfor n-type TFETs with donor-like and acceptor-like ITs.

Lateral InAs/Si p-Type Tunnel FETs Integrated on Si—Part 2: Simulation Study of the Impact of Interface Traps

2016 ◽  
Vol 63 (11) ◽  
pp. 4240-4247 ◽  
Author(s):  
Saurabh Sant ◽  
Kirsten Moselund ◽  
Davide Cutaia ◽  
Heinz Schmid ◽  
Mattias Borg ◽  
...  
Keyword(s):  
Simulation Study ◽  
Interface Traps ◽  
Tunnel Fets ◽  
P Type ◽  
The Impact

2D MoS 2 Charge Injection Memory Transistors Utilizing Hetero‐Stack SiO 2 /HfO 2 Dielectrics and Oxide Interface Traps

2021 ◽  
pp. 2100074
Author(s):  
Livia Janice Widiapradja ◽  
Taewook Nam ◽  
Yeonsu Jeong ◽  
Hye‐Jin Jin ◽  
Yangjin Lee ◽  
...  
Keyword(s):  
Charge Injection ◽  
Interface Traps ◽  
Oxide Interface

A Method to Characterize n[sup +]-Polysilicon/Oxide Interface Traps in Ultrathin Oxides

2001 ◽  
Vol 4 (6) ◽  
pp. G47 ◽  
Author(s):  
Kow Ming Chang ◽  
Yuan Hung Chung ◽  
Tzyk Cheang Lee ◽  
Yong Long Sun
Keyword(s):  
Interface Traps ◽  
Oxide Interface ◽  
Ultrathin Oxides

Effects of oxide interface traps and transient enhanced diffusion on the process modeling of PMOS devices

1996 ◽  
Vol 43 (7) ◽  
pp. 1144-1152 ◽  
Author(s):  
H.-H. Vuong ◽  
C.S. Rafferty ◽  
S.A. Eshraghi ◽  
J.L. Lentz ◽  
P.M. Zeitzoff ◽  
...  
Keyword(s):  
Process Modeling ◽  
Interface Traps ◽  
Oxide Interface ◽  
Enhanced Diffusion ◽  
Transient Enhanced Diffusion
Sign in / Sign up

Export Citation Format

Share Document