Error-prediction analyses in 1X, 2X and 3Xnm NAND flash memories for system-level reliability improvement of solid-state drives (SSDs)
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2011 ◽
Vol E94-C
(4)
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pp. 539-547
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2017 ◽
Vol 17
(4)
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pp. 713-721
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2016 ◽
Vol 24
(1)
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pp. 115-128
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2010 ◽
Vol E93-C
(3)
◽
pp. 317-323
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