MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series
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Published By Springer International Publishing

9783319224572, 9783319224589

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Tapered Cantilevered Bimorphs for Piezoelectric Energy Harvesting: Characterization with Impedance Spectroscopy

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-319-22458-9_8 ◽

2016 ◽

pp. 51-57

Author(s):

Naved A. Siddiqui ◽

Dong-Joo Kim ◽

Ruel A. Overfelt ◽

Barton C. Prorok

Keyword(s):

Impedance Spectroscopy ◽

Energy Harvesting ◽

Piezoelectric Energy Harvesting ◽

Piezoelectric Energy

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In Situ TEM Nanomechanical Testing

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-319-22458-9_2 ◽

2016 ◽

pp. 9-16

Author(s):

Josh Kacher ◽

Qian Yu ◽

Claire Chisholm ◽

Christoph Gammer ◽

Andrew M. Minor

Keyword(s):

In Situ Tem ◽

Nanomechanical Testing

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Evaluating Pile-Up and Sink-In During Nanoindentation of Thin Films

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-319-22458-9_7 ◽

2016 ◽

pp. 45-50 ◽

Cited By ~ 1

Author(s):

MariAnne Sullivan ◽

Bart Prorok

Keyword(s):

Thin Films ◽

Pile Up

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Nano to Macro: Mechanical Evaluation of Macroscopically Long Individual Nanofibers

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-319-22458-9_6 ◽

2016 ◽

pp. 35-43 ◽

Cited By ~ 2

Author(s):

D. Papkov ◽

K. Maleckis ◽

Y. Zou ◽

M. Andalib ◽

A. Goponenko ◽

...

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High Rate Experimental Test Method for Harsh Environment Stretchable Electronics

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-319-22458-9_12 ◽

2016 ◽

pp. 89-96 ◽

Cited By ~ 1

Author(s):

Ryan Lowe ◽

Steve Dooley ◽

Dan Berrigan ◽

Jason Foley

Keyword(s):

Experimental Test ◽

Test Method ◽

High Rate ◽

Harsh Environment ◽

Stretchable Electronics

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Poisson’s Ratio as a Damage Index Sensed by Dual-Embedded Fiber Bragg Grating Sensor

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-319-22458-9_3 ◽

2016 ◽

pp. 17-24

Author(s):

C. Yılmaz ◽

E. Akay ◽

E. S. Kocaman ◽

M. Yildiz

Keyword(s):

Fiber Bragg Grating ◽

Poisson’S Ratio ◽

Damage Index ◽

Fiber Bragg Grating Sensor ◽

Poisson's Ratio ◽

Bragg Grating ◽

Bragg Grating Sensor

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Time and Temperature Dependence of Stress Relaxation in Al and Al Alloy Thin Films Application for MEMS

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-319-22458-9_9 ◽

2016 ◽

pp. 59-64

Author(s):

A.-W. Huang ◽

C.-H. Lu ◽

C.-C. Wu ◽

M.-T. Lin

Keyword(s):

Thin Films ◽

Stress Relaxation ◽

Temperature Dependence ◽

Al Alloy

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Application of Nanoindentation and Microdiffraction to Study Aging Effects in Lead Free Solder Interconnects

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-319-22458-9_11 ◽

2016 ◽

pp. 73-88 ◽

Cited By ~ 1

Author(s):

Md Hasnine ◽

Jeffrey C. Suhling ◽

Barton C. Prorok ◽

Michael J. Bozack ◽

Pradeep Lall

Keyword(s):

Lead Free ◽

Lead Free Solder ◽

Aging Effects ◽

Solder Interconnects ◽

Free Solder

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Measurement of the Electromechanical Response of Capacitors in Dynamic Loading Conditions

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-319-22458-9_13 ◽

2016 ◽

pp. 97-108 ◽

Cited By ~ 1

Author(s):

Sergey M. Kaplan ◽

Robert B. Greendyke ◽

Ryan D. Lowe ◽

Jason R. Foley

Keyword(s):

Dynamic Loading ◽

Loading Conditions ◽

Dynamic Loading Conditions

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Oxide Driven Strength Degradation of (1 1 1) Silicon Surfaces

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-319-22458-9_1 ◽

2016 ◽

pp. 1-7

Author(s):

Scott J. Grutzik ◽

Alan T. Zehnder

Keyword(s):

Strength Degradation ◽

Silicon Surfaces

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MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics SeriesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer International Publishing

Tapered Cantilevered Bimorphs for Piezoelectric Energy Harvesting: Characterization with Impedance Spectroscopy

In Situ TEM Nanomechanical Testing

Evaluating Pile-Up and Sink-In During Nanoindentation of Thin Films

Nano to Macro: Mechanical Evaluation of Macroscopically Long Individual Nanofibers

High Rate Experimental Test Method for Harsh Environment Stretchable Electronics

Poisson’s Ratio as a Damage Index Sensed by Dual-Embedded Fiber Bragg Grating Sensor

Time and Temperature Dependence of Stress Relaxation in Al and Al Alloy Thin Films Application for MEMS

Application of Nanoindentation and Microdiffraction to Study Aging Effects in Lead Free Solder Interconnects

Measurement of the Electromechanical Response of Capacitors in Dynamic Loading Conditions

Oxide Driven Strength Degradation of (1 1 1) Silicon Surfaces

MEMS and Nanotechnology, Volume 5 - Conference Proceedings of the Society for Experimental Mechanics Series
Latest Publications