ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.

2004 ◽

Cited By ~ 2

Author(s):

A.V. Mule ◽

P.J. Joseph ◽

S.-A.B. Allen ◽

P.A. Kohl ◽

T.K. Gaylord ◽

...

Keyword(s):

Optical Interconnect ◽

Gigascale Integration

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Measurements, modelling and electrical simulations of lateral PIN photodiodes in thin film-SOI for high quantum efficiency and high selectivity in the UV range

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. ◽

10.1109/essderc.2003.1256809 ◽

2004 ◽

Cited By ~ 4

Author(s):

A. Afzalian ◽

D. Flandre

Keyword(s):

Thin Film ◽

Quantum Efficiency ◽

High Selectivity ◽

High Quantum Efficiency ◽

High Quantum ◽

Pin Photodiodes ◽

Uv Range

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Monolithic active pixel sensor for dosimetry application

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. ◽

10.1109/essderc.2003.1256811 ◽

2004 ◽

Cited By ~ 4

Author(s):

F. Cannillo ◽

G. Deptuch ◽

W. Dulinski

Keyword(s):

Active Pixel Sensor ◽

Active Pixel

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A novel ultra-low power reset/read-out technique for megapixels current-mode CMOS imagers

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. ◽

10.1109/essderc.2003.1256810 ◽

2004 ◽

Author(s):

F. Boussaid ◽

A. Bermak ◽

A. Bouzerdoum

Keyword(s):

Low Power ◽

Current Mode ◽

Ultra Low Power ◽

Cmos Imagers

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Temperature operation of FDSOI devices with metal gate (TaSiN) and high-k dielectric

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. ◽

10.1109/essderc.2003.1256941 ◽

2004 ◽

Cited By ~ 3

Author(s):

J. Pretet ◽

A. Vandooren ◽

S. Ciistoloveanu

Keyword(s):

Metal Gate ◽

High K ◽

High K Dielectric

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Carrier quantization in SOI MOSFETs using an effective potential based Monte-Carlo tool

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. ◽

10.1109/essderc.2003.1256900 ◽

2004 ◽

Cited By ~ 7

Author(s):

P. Palestri ◽

D. Esseni ◽

A. Abramo ◽

R. Clerc ◽

L. Selmi

Keyword(s):

Monte Carlo ◽

Effective Potential

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Modelling and simulating the selective epitaxial growth of silicon under consideration of anisotropic growth rates

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. ◽

10.1109/essderc.2003.1256895 ◽

2004 ◽

Author(s):

R.G. Spallek ◽

D. Temmler ◽

T. Preusser ◽

T. Ronsch ◽

S. Ulbrich

Keyword(s):

Epitaxial Growth ◽

Growth Rates ◽

Anisotropic Growth ◽

Selective Epitaxial Growth

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Interface coupling and film thickness measurement on thin oxide thin film fully depleted SOI MOSFETs

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. ◽

10.1109/essderc.2003.1256817 ◽

2004 ◽

Cited By ~ 3

Author(s):

M. Casse ◽

T. Poiroux ◽

O. Faynot ◽

C. Raynaud ◽

C. Tabone ◽

...

Keyword(s):

Thin Film ◽

Film Thickness ◽

Thickness Measurement ◽

Oxide Thin Film ◽

Fully Depleted ◽

Interface Coupling ◽

Thin Oxide ◽

Film Thickness Measurement

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Simulation of carrier transport in carbon nanotube field effect transistors

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. ◽

10.1109/essderc.2003.1256901 ◽

2004 ◽

Cited By ~ 4

Author(s):

E. Ungersbock ◽

A. Gehring ◽

H. Kosina ◽

S. Selberherr ◽

Byoung-Ho Cheong ◽

...

Keyword(s):

Carbon Nanotube ◽

Field Effect ◽

Carrier Transport ◽

Field Effect Transistors

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Deep trench isolation for 600 V SOI power devices

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. ◽

10.1109/essderc.2003.1256922 ◽

2004 ◽

Cited By ~ 3

Author(s):

L. Clavelier ◽

B. Charlet ◽

B. Giffard ◽

M. Roy

Keyword(s):

Power Devices ◽

Deep Trench ◽

Trench Isolation

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ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Polymer optical interconnect technologies for polylithic gigascale integration

Measurements, modelling and electrical simulations of lateral PIN photodiodes in thin film-SOI for high quantum efficiency and high selectivity in the UV range

Monolithic active pixel sensor for dosimetry application

A novel ultra-low power reset/read-out technique for megapixels current-mode CMOS imagers

Temperature operation of FDSOI devices with metal gate (TaSiN) and high-k dielectric

Carrier quantization in SOI MOSFETs using an effective potential based Monte-Carlo tool

Modelling and simulating the selective epitaxial growth of silicon under consideration of anisotropic growth rates

Interface coupling and film thickness measurement on thin oxide thin film fully depleted SOI MOSFETs

Simulation of carrier transport in carbon nanotube field effect transistors

Deep trench isolation for 600 V SOI power devices

Export Citation Format

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Polymer optical interconnect technologies for polylithic gigascale integration

Measurements, modelling and electrical simulations of lateral PIN photodiodes in thin film-SOI for high quantum efficiency and high selectivity in the UV range

Monolithic active pixel sensor for dosimetry application

A novel ultra-low power reset/read-out technique for megapixels current-mode CMOS imagers

Temperature operation of FDSOI devices with metal gate (TaSiN) and high-k dielectric

Carrier quantization in SOI MOSFETs using an effective potential based Monte-Carlo tool

Modelling and simulating the selective epitaxial growth of silicon under consideration of anisotropic growth rates

Interface coupling and film thickness measurement on thin oxide thin film fully depleted SOI MOSFETs

Simulation of carrier transport in carbon nanotube field effect transistors

Deep trench isolation for 600 V SOI power devices

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.
Latest Publications