2006 IEEE International Reliability Physics Symposium Proceedings
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181
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19
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0780394984
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Analysis of the Back-Gate Effect on the On-State Breakdown Voltage of Smartpower SOI Devices

2006 ◽  
Author(s):  
Stefan Schwantes ◽  
Josef Furthaler ◽  
Bernd Schauwecker ◽  
Franz Dietz ◽  
Michael Graf ◽  
...  
Keyword(s):  
Breakdown Voltage ◽  
Back Gate ◽  
Gate Effect ◽  
Soi Devices ◽  
State Breakdown

Detection of Electron Trap Generation due to Constant Voltage Stress on High-κ Gate Stacks

2006 ◽  
Author(s):  
C.d. Young ◽  
S. Nadkarni ◽  
D. Heh ◽  
H.R. Harris ◽  
R. Choi ◽  
...  
Keyword(s):  
Electron Trap ◽  
Constant Voltage ◽  
Gate Stacks ◽  
Voltage Stress

Mechanism of Gradual Increase of Gate Current in High-K Gate Dielectrics and Its Application to Reliability Assessment

2006 ◽  
Author(s):  
Kenji Okada ◽  
Tsuyoshi Horikawa ◽  
Hideki Satake ◽  
Hiroyuki Ota ◽  
Arito Ogawa ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Gradual Increase ◽  
Reliability Assessment ◽  
Gate Current ◽  
High K

Switching Time Extraction of CMOS Gates using Time-Resolved Emission (TRE)

2006 ◽  
Author(s):  
Franco Stellari ◽  
Alberto Tosi ◽  
Peilin Song
Keyword(s):  
Switching Time ◽  
Time Resolved

Large-Scale Time Characterization and Analysis of PBTI In HFO2/Metal Gate Stacks

2006 ◽  
Author(s):  
J. Mitard ◽  
X. Garros ◽  
L.p. Nguyen ◽  
C. Leroux ◽  
G. Ghibaudo ◽  
...  
Keyword(s):  
Large Scale ◽  
Gate Stacks ◽  
Metal Gate

A Comprehensive Study of Low-k SiCOH TDDB Phenomena and Its Reliability Lifetime Model Development

2006 ◽  
Author(s):  
F. Chen ◽  
O. Bravo ◽  
K. Chanda ◽  
P. McLaughlin ◽  
T. Sullivan ◽  
...  
Keyword(s):  
Model Development ◽  
Lifetime Model ◽  
Low K ◽  
Comprehensive Study

Stable and Reliable Q-Factor in Resonant MEMS with Getter Film

2006 ◽  
Author(s):  
G. Longoni ◽  
A. Conte ◽  
M. Moraja ◽  
A. Fourrier
Keyword(s):  
Q Factor

Hot-Carrier Photoemission in Scaled CMOS Technologies: A Challenge for Emission Based Testing and Diagnostics

2006 ◽  
Author(s):  
Alberto Tosi ◽  
Franco Stellari ◽  
Andrea Pigozzi ◽  
Giulio Marchesi ◽  
Franco Zappa
Keyword(s):  
Hot Carrier ◽  
Scaled Cmos
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