Detection of Electron Trap Generation due to Constant Voltage Stress on High-κ Gate Stacks

2006 ◽  
Author(s):  
C.d. Young ◽  
S. Nadkarni ◽  
D. Heh ◽  
H.R. Harris ◽  
R. Choi ◽  
...  
Keyword(s):  
Electron Trap ◽  
Constant Voltage ◽  
Gate Stacks ◽  
Voltage Stress

Electron Trap Generation in High-$kappa$Gate Stacks by Constant Voltage Stress

2006 ◽  
Vol 6 (2) ◽  
pp. 123-131 ◽  
Author(s):  
C.D. Young ◽  
D. Heh ◽  
S.V. Nadkarni ◽  
R. Choi ◽  
J.J. Peterson ◽  
...  
Keyword(s):  
Electron Trap ◽  
Constant Voltage ◽  
Gate Stacks ◽  
Voltage Stress

Defects Generation under Constant Voltage Stress in La2O3/HfO2 Gate Stacks Grown on Ge Substrates

2019 ◽  
Vol 25 (6) ◽  
pp. 105-111 ◽  
Author(s):  
Evangelos K. Evangelou ◽  
M. S. Rahman ◽  
Athanasios Dimoulas ◽  
Sotiria Galata
Keyword(s):  
Constant Voltage ◽  
Gate Stacks ◽  
Voltage Stress

Investigation of the effects of constant voltage stress on thin SiO2 layers using dynamic measurement protocols

2012 ◽  
Vol 52 (9-10) ◽  
pp. 1895-1900 ◽  
Author(s):  
Philippe Chiquet ◽  
Pascal Masson ◽  
Romain Laffont ◽  
Gilles Micolau ◽  
Jérémy Postel-Pellerin ◽  
...  
Keyword(s):  
Dynamic Measurement ◽  
Constant Voltage ◽  
Voltage Stress

scholarly journals Characterization of Dielectric Relaxation and Reliability of High-k MIM Capacitor Under Constant Voltage Stress

2014 ◽  
Vol 14 (5) ◽  
pp. 543-548 ◽  
Author(s):  
Ho-Young Kwak ◽  
Sung-Kyu Kwon ◽  
Hyuk-Min Kwon ◽  
Seung-Yong Sung ◽  
Su Lim ◽  
...  
Keyword(s):  
Dielectric Relaxation ◽  
Constant Voltage ◽  
High K ◽  
Voltage Stress

Behavior of Local Charge-Trapping Sites in La2O3–Al2O3Composite Films under Constant Voltage Stress

2007 ◽  
Vol 46 (4B) ◽  
pp. 1879-1884 ◽  
Author(s):  
Toshifumi Sago ◽  
Akiyoshi Seko ◽  
Mitsuo Sakashita ◽  
Akira Sakai ◽  
Masaki Ogawa ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Constant Voltage ◽  
Local Charge ◽  
Voltage Stress ◽  
Trapping Sites
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