Simulation of Semiconductor Processes and Devices 2004
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Published By Springer Vienna

9783709172124, 9783709106242
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scholarly journals Simulation of the Cross-Coupling among Snap Back Devices under Transient High Current Stress

2004 ◽  
pp. 211-214
Author(s):  
G. Groos ◽  
N. Jensen ◽  
M. Denison ◽  
M. Stecher
Keyword(s):  
Cross Coupling ◽  
High Current ◽  
Current Stress ◽  
The Cross

scholarly journals Ab-initio Calculations to Predict Stress Effects on Boron Solubility in Silicon

2004 ◽  
pp. 37-40 ◽  
Author(s):  
Milan Diebel ◽  
Srini Chakravarthi ◽  
Scott T. Dunham ◽  
Charles F. Machala
Keyword(s):  
Ab Initio Calculations ◽  
Ab Initio ◽  
Stress Effects

Modeling B Uphill Diffusion in the Presence of Ge

2004 ◽  
pp. 33-36
Author(s):  
Ljubo Radic ◽  
Antonio F. Saavedra ◽  
Mark E. Law
Keyword(s):  
Uphill Diffusion

SET Accurate Compact Model for SET-MOSFET Hybrid Circuit Simulation

2004 ◽  
pp. 267-270
Author(s):  
C. Le Royer ◽  
G. Le Carval ◽  
M. Sanquer
Keyword(s):  
Circuit Simulation ◽  
Compact Model ◽  
Hybrid Circuit

SPICE-Compatible Macro Model for Split-Gate Compact NVM Cell with Various Gap Sizes

2004 ◽  
pp. 263-266 ◽  
Author(s):  
Nader Akil ◽  
Ronald van Langevelde ◽  
Pierre Goarin ◽  
Michiel van Duuren ◽  
Michiel Slotboom
Keyword(s):  
Macro Model

Very High Performance, Sub-20nm, Strained Si and Six Ge1-x, Hetero-structure, Center Channel (CC) NMOS and PMOS DGFETs

2004 ◽  
pp. 191-194 ◽  
Author(s):  
Tejas Krishnamohan ◽  
Christoph Jungemann ◽  
Krishna C. Saraswat
Keyword(s):  
High Performance ◽  
Strained Si ◽  
Hetero Structure ◽  
Center Channel ◽  
Very High

Full Three-Dimensional Analysis of a Non-Volatile Memory Cell

2004 ◽  
pp. 129-132 ◽  
Author(s):  
A. Hössinger ◽  
R. Minixhofer ◽  
S. Selberherr
Keyword(s):  
Dimensional Analysis ◽  
Three Dimensional ◽  
Memory Cell ◽  
Non Volatile Memory ◽  
Volatile Memory

Modeling of Stress Induced Layout Effect on Electrical Characteristics of Advanced MOSFETs

2004 ◽  
pp. 61-64 ◽  
Author(s):  
O. Fujii ◽  
H. Yoshimura ◽  
R. Hasumi ◽  
T. Sanuki ◽  
H. Oyamatsu ◽  
...  
Keyword(s):  
Electrical Characteristics
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