Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium

A first generation generic system simulator (GENESYS) and its relation to the NTRS

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium ◽

10.1109/ugim.1995.514135 ◽

2002 ◽

Cited By ~ 1

Author(s):

J.C. Eble ◽

V.K. De ◽

J.D. Meindl

Keyword(s):

First Generation ◽

Generic System

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A sub-threshold leakage mechanism in multiple-implanted LDD structures in BiCMOS technology

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium ◽

10.1109/ugim.1995.514131 ◽

2002 ◽

Cited By ~ 1

Author(s):

M.G. Guvench ◽

M. Robinson

Keyword(s):

Leakage Mechanism ◽

Bicmos Technology

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An efficient physics-based gate current calculation by solving space-dependent Boltzmann transport equation

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium ◽

10.1109/ugim.1995.514143 ◽

2002 ◽

Cited By ~ 1

Author(s):

Hongchin Lin ◽

J.Z. Peng ◽

N. Goldsman ◽

I.D. Mayergoyz

Keyword(s):

Transport Equation ◽

Boltzmann Transport Equation ◽

Boltzmann Transport ◽

Gate Current ◽

Current Calculation

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Semiconductor technology transfer from universities to industry

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium ◽

10.1109/ugim.1995.514105 ◽

2002 ◽

Cited By ~ 1

Author(s):

L.M. Bearden ◽

N.F. Foster ◽

M. Khan

Keyword(s):

Technology Transfer ◽

Semiconductor Technology

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Total quality manufacturing at the RIT integrated circuit factory

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium ◽

10.1109/ugim.1995.514116 ◽

2002 ◽

Cited By ~ 4

Author(s):

L.F. Fuller ◽

K.D. Hirschman ◽

P.C. Waldrop

Keyword(s):

Integrated Circuit ◽

Total Quality

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A microwave model for high electron mobility transistors

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium ◽

10.1109/ugim.1995.514141 ◽

2002 ◽

Author(s):

H. Ahn ◽

M.A. El Nokali

Keyword(s):

Electron Mobility ◽

High Electron Mobility Transistors ◽

High Electron ◽

High Electron Mobility ◽

Electron Mobility Transistors

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Joint development of a topography simulator at National Semiconductor Corporation and Arizona State University

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium ◽

10.1109/ugim.1995.514137 ◽

2002 ◽

Author(s):

H. Stippel ◽

H. Liao ◽

K. Reddy ◽

S. Saha

Keyword(s):

State University ◽

Arizona State University ◽

Joint Development ◽

National Semiconductor

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Software as a method of technology transfer

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium ◽

10.1109/ugim.1995.514106 ◽

2002 ◽

Cited By ~ 1

Author(s):

M. Osterman ◽

C. Rust ◽

T. Stadterman ◽

P. Jackson ◽

M. Rosman ◽

...

Keyword(s):

Technology Transfer

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Operating high variability manufacturing systems

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium ◽

10.1109/ugim.1995.514117 ◽

2002 ◽

Cited By ~ 1

Author(s):

A.M. Bonvik ◽

S.B. Gershwin ◽

D.E. Troxel

Keyword(s):

Manufacturing Systems ◽

High Variability

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Introduction of a surface charge analysis instrument into the microelectronic engineering curricula at the Rochester Institute of Technology

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium ◽

10.1109/ugim.1995.514152 ◽

2002 ◽

Author(s):

M.A. Jackson ◽

J.A. Will

Keyword(s):

Surface Charge ◽

Rochester Institute Of Technology ◽

Analysis Instrument ◽

Charge Analysis ◽

Institute Of Technology

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Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A first generation generic system simulator (GENESYS) and its relation to the NTRS

A sub-threshold leakage mechanism in multiple-implanted LDD structures in BiCMOS technology

An efficient physics-based gate current calculation by solving space-dependent Boltzmann transport equation

Semiconductor technology transfer from universities to industry

Total quality manufacturing at the RIT integrated circuit factory

A microwave model for high electron mobility transistors

Joint development of a topography simulator at National Semiconductor Corporation and Arizona State University

Software as a method of technology transfer

Operating high variability manufacturing systems

Introduction of a surface charge analysis instrument into the microelectronic engineering curricula at the Rochester Institute of Technology

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Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics SymposiumLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A first generation generic system simulator (GENESYS) and its relation to the NTRS

A sub-threshold leakage mechanism in multiple-implanted LDD structures in BiCMOS technology

An efficient physics-based gate current calculation by solving space-dependent Boltzmann transport equation

Semiconductor technology transfer from universities to industry

Total quality manufacturing at the RIT integrated circuit factory

A microwave model for high electron mobility transistors

Joint development of a topography simulator at National Semiconductor Corporation and Arizona State University

Software as a method of technology transfer

Operating high variability manufacturing systems

Introduction of a surface charge analysis instrument into the microelectronic engineering curricula at the Rochester Institute of Technology

Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium
Latest Publications