Interaction of a Plane Wave and a Plane Interface

2010 ◽  
pp. 29-59
Author(s):  
Philippe Gatignol ◽  
Catherine Potel ◽  
Jean Franois de Belleval
Keyword(s):  
Geophysics ◽  
1988 ◽  
Vol 53 (2) ◽  
pp. 271-275 ◽  
Author(s):  
C. A. Rendleman ◽  
F. K. Levin

At a workshop on refraction and wide‐angle reflections, Hilterman (1985) pointed out that, in contrast to the plane‐wave case, when there is a point source, a P-wave reflected from a plane interface attains its maximum amplitude at an offset greater than that corresponding to the critical angle (Figure 1). The same conclusion had been drawn earlier by Červený (1967). However, neither Červený’s results, which were based on very complicated mathematical expressions derived by Brekhovskikh (1960), nor Hilterman’s computer‐generated data shed light on the physics implied by the shifted maximum.


1961 ◽  
Vol 39 (2) ◽  
pp. 272-275 ◽  
Author(s):  
W. E. Williams

It is shown that the solution for the reflection and refraction of a plane pulse at a plane interface may be obtained, by Fourier synthesis, from the corresponding solution for a time-harmonic plane wave even when the angle of incidence is such that total reflection occurs. The application of the Fourier superposition method to problems involving both refraction and diffraction is also discussed.


2004 ◽  
Vol 12 (02) ◽  
pp. 233-256 ◽  
Author(s):  
ARNAUD COATANHAY ◽  
JEAN-MARC CONOIR

A new method for predicting the scattered acoustic field due to a plane wave incident upon an infinitely long cylinder lying near an penetrable plane interface is presented. The method generalizes the method of images which is restricted to rigid and soft plane interfaces. Validity domains, physical interpretations, simulations and numerical results are described for sedimentary medium-fluid plane interfaces. And, they are well compared with high frequency asymptotic results based on the Geometrical Theory of Diffraction(G.T.D.).


Author(s):  
J. M. Pankratz

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).


1997 ◽  
Vol 92 (3) ◽  
pp. 477-487 ◽  
Author(s):  
GERALD LIPPERT ◽  
JuRG HUTTER ◽  
MICHELE PARRINELLO

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