Random field modeling of microstructure in unidirectional FRP using SEM‐image and image processing for multiscale stochastic stress analysis considering random fiber arrangement

2021 ◽  
Author(s):  
Yuki Arai ◽  
Keitaro Fukuda ◽  
Sei-ichiro Sakata
Keyword(s):  
Image Processing ◽  
Random Field ◽  
Stress Analysis ◽  
Sem Image ◽  
Field Modeling ◽  
Fiber Arrangement

A Color Coded STEM/SEM Image Storage System

1981 ◽  
Vol 39 ◽  
pp. 272-273
Author(s):  
Y. Kokubo ◽  
W. H. Hardy ◽  
J. Dance ◽  
K. Jones
Keyword(s):  
Image Processing ◽  
Electron Beam ◽  
Storage System ◽  
Particle Analysis ◽  
Specific Information ◽  
X Rays ◽  
Sem Image ◽  
Backscattered Electrons ◽  
Wide Range ◽  
Scanning Electron

A color coded digital image processing is accomplished by using JEM100CX TEM SCAN and ORTEC’s LSI-11 computer based multi-channel analyzer (EEDS-II-System III) for image analysis and display. Color coding of the recorded image enables enhanced visualization of the image using mathematical techniques such as compression, gray scale expansion, gamma-processing, filtering, etc., without subjecting the sample to further electron beam irradiation once images have been stored in the memory.The powerful combination between a scanning electron microscope and computer is starting to be widely used 1) - 4) for the purpose of image processing and particle analysis. Especially, in scanning electron microscopy it is possible to get all information resulting from the interactions between the electron beam and specimen materials, by using different detectors for signals such as secondary electron, backscattered electrons, elastic scattered electrons, inelastic scattered electrons, un-scattered electrons, X-rays, etc., each of which contains specific information arising from their physical origin, study of a wide range of effects becomes possible.

scholarly journals Spectral Approximation of Fractional PDEs in Image Processing and Phase Field Modeling

2017 ◽  
Vol 17 (4) ◽  
pp. 661-678 ◽  
Author(s):  
Harbir Antil ◽  
Sören Bartels
Keyword(s):  
Image Processing ◽  
Phase Field ◽  
Differential Operators ◽  
Mathematical Tool ◽  
Phase Field Models ◽  
Field Modeling ◽  
Regularity Properties ◽  
Fractional Pdes ◽  
Fractional Differential ◽  
Fractional Differential Operators

AbstractFractional differential operators provide an attractive mathematical tool to model effects with limited regularity properties. Particular examples are image processing and phase field models in which jumps across lower dimensional subsets and sharp transitions across interfaces are of interest. The numerical solution of corresponding model problems via a spectral method is analyzed. Its efficiency and features of the model problems are illustrated by numerical experiments.

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